Daily Papers

Industrial defect detection systems face critical limitations when confined to one-class anomaly detection paradigms, which assume uniform outlier distributions and struggle with data scarcity in realworld manufacturing environments. We present ExDD (Explicit Dual Distribution), a novel framework that transcends these limitations by explicitly modeling dual feature distributions. Our approach leverages parallel memory banks that capture the distinct statistical properties of both normality and anomalous patterns, addressing the fundamental flaw of uniform outlier assumptions. To overcome data scarcity, we employ latent diffusion models with domain-specific textual conditioning, generating in-distribution synthetic defects that preserve industrial context. Our neighborhood-aware ratio scoring mechanism elegantly fuses complementary distance metrics, amplifying signals in regions exhibiting both deviation from normality and similarity to known defect patterns. Experimental validation on KSDD2 demonstrates superior performance (94.2% I-AUROC, 97.7% P-AUROC), with optimal augmentation at 100 synthetic samples.

Developing effective visual inspection models remains challenging due to the scarcity of defect data. While image generation models have been used to synthesize defect images, producing highly realistic defects remains difficult. We propose DefectFill, a novel method for realistic defect generation that requires only a few reference defect images. It leverages a fine-tuned inpainting diffusion model, optimized with our custom loss functions incorporating defect, object, and attention terms. It enables precise capture of detailed, localized defect features and their seamless integration into defect-free objects. Additionally, our Low-Fidelity Selection method further enhances the defect sample quality. Experiments show that DefectFill generates high-quality defect images, enabling visual inspection models to achieve state-of-the-art performance on the MVTec AD dataset.

Defect inspection is paramount within the closed-loop manufacturing system. However, existing datasets for defect inspection often lack precision and semantic granularity required for practical applications. In this paper, we introduce the Defect Spectrum, a comprehensive benchmark that offers precise, semantic-abundant, and large-scale annotations for a wide range of industrial defects. Building on four key industrial benchmarks, our dataset refines existing annotations and introduces rich semantic details, distinguishing multiple defect types within a single image. Furthermore, we introduce Defect-Gen, a two-stage diffusion-based generator designed to create high-quality and diverse defective images, even when working with limited datasets. The synthetic images generated by Defect-Gen significantly enhance the efficacy of defect inspection models. Overall, The Defect Spectrum dataset demonstrates its potential in defect inspection research, offering a solid platform for testing and refining advanced models.

We present the Open Stamped Parts Dataset (OSPD), featuring synthetic and real images of stamped metal sheets for auto manufacturing. The real part images, captured from 7 cameras, consist of 7,980 unlabeled images and 1,680 labeled images. In addition, we have compiled a defect dataset by overlaying synthetically generated masks on 10\% of the holes. The synthetic dataset replicates the real manufacturing environment in terms of lighting and part placement relative to the cameras. The synthetic data includes 7,980 training images, 1,680 validation images and 1,680 test images, each with bounding box and segmentation mask annotations around all holes. 10\% of the holes in the synthetic data mimic defects generated in the real image dataset. We trained a hole-detection model on the synthetic-OSPD, achieving a modified recall score of 67.2\% and a precision of 94.4\% . We anticipate researchers in auto manufacturing use OSPD to advance the state of the art in defect detection of stamped holes in the metal-sheet stamping process. The dataset is available for download at: https://tinyurl.com/hm6xatd7.

3D anomaly detection plays a crucial role in monitoring parts for localized inherent defects in precision manufacturing. Embedding-based and reconstruction-based approaches are among the most popular and successful methods. However, there are two major challenges to the practical application of the current approaches: 1) the embedded models suffer the prohibitive computational and storage due to the memory bank structure; 2) the reconstructive models based on the MAE mechanism fail to detect anomalies in the unmasked regions. In this paper, we propose R3D-AD, reconstructing anomalous point clouds by diffusion model for precise 3D anomaly detection. Our approach capitalizes on the data distribution conversion of the diffusion process to entirely obscure the input's anomalous geometry. It step-wisely learns a strict point-level displacement behavior, which methodically corrects the aberrant points. To increase the generalization of the model, we further present a novel 3D anomaly simulation strategy named Patch-Gen to generate realistic and diverse defect shapes, which narrows the domain gap between training and testing. Our R3D-AD ensures a uniform spatial transformation, which allows straightforwardly generating anomaly results by distance comparison. Extensive experiments show that our R3D-AD outperforms previous state-of-the-art methods, achieving 73.4% Image-level AUROC on the Real3D-AD dataset and 74.9% Image-level AUROC on the Anomaly-ShapeNet dataset with an exceptional efficiency.

Synthetic dataset generation in Computer Vision, particularly for industrial applications, is still underexplored. Industrial defect segmentation, for instance, requires highly accurate labels, yet acquiring such data is costly and time-consuming. To address this challenge, we propose a novel diffusion-based pipeline for generating high-fidelity industrial datasets with minimal supervision. Our approach conditions the diffusion model on enriched bounding box representations to produce precise segmentation masks, ensuring realistic and accurately localized defect synthesis. Compared to existing layout-conditioned generative methods, our approach improves defect consistency and spatial accuracy. We introduce two quantitative metrics to evaluate the effectiveness of our method and assess its impact on a downstream segmentation task trained on real and synthetic data. Our results demonstrate that diffusion-based synthesis can bridge the gap between artificial and real-world industrial data, fostering more reliable and cost-efficient segmentation models. The code is publicly available at https://github.com/covisionlab/diffusion_labeling.

Out-of-distribution (OOD) detection is critical to ensure the safe deployment of deep learning models in critical applications. Deep learning models can often misidentify OOD samples as in-distribution (ID) samples. This vulnerability worsens in the presence of spurious correlation in the training set. Likewise, in fine-grained classification settings, detection of fine-grained OOD samples becomes inherently challenging due to their high similarity to ID samples. However, current research on OOD detection has largely ignored these challenging scenarios, focusing instead on relatively easier (conventional) cases. In this work, we present a unified Approach to Spurious, fine-grained, and Conventional OOD Detection (ASCOOD). First, we propose synthesizing virtual outliers from ID data by approximating the destruction of invariant features. To this end, we identify invariant features with the pixel attribution method using the model being learned. This approach eliminates the burden of curating external OOD datasets. Then, we simultaneously incentivize ID classification and predictive uncertainty towards virtual outliers leveraging standardized feature representation. Our approach effectively mitigates the impact of spurious correlations and encourages capturing fine-grained attributes. Extensive experiments across seven datasets demonstrate the merit of ASCOOD in spurious, fine-grained, and conventional settings. The code is available at: https://github.com/sudarshanregmi/ASCOOD/

Deep learning has recently achieved initial success in program analysis tasks such as bug detection. Lacking real bugs, most existing works construct training and test data by injecting synthetic bugs into correct programs. Despite achieving high test accuracy (e.g., 90%), the resulting bug detectors are found to be surprisingly unusable in practice, i.e., <10% precision when used to scan real software repositories. In this work, we argue that this massive performance difference is caused by a distribution shift, i.e., a fundamental mismatch between the real bug distribution and the synthetic bug distribution used to train and evaluate the detectors. To address this key challenge, we propose to train a bug detector in two phases, first on a synthetic bug distribution to adapt the model to the bug detection domain, and then on a real bug distribution to drive the model towards the real distribution. During these two phases, we leverage a multi-task hierarchy, focal loss, and contrastive learning to further boost performance. We evaluate our approach extensively on three widely studied bug types, for which we construct new datasets carefully designed to capture the real bug distribution. The results demonstrate that our approach is practically effective and successfully mitigates the distribution shift: our learned detectors are highly performant on both our test set and the latest version of open source repositories. Our code, datasets, and models are publicly available at https://github.com/eth-sri/learning-real-bug-detector.

We introduce a simple and intuitive self-supervision task, Natural Synthetic Anomalies (NSA), for training an end-to-end model for anomaly detection and localization using only normal training data. NSA integrates Poisson image editing to seamlessly blend scaled patches of various sizes from separate images. This creates a wide range of synthetic anomalies which are more similar to natural sub-image irregularities than previous data-augmentation strategies for self-supervised anomaly detection. We evaluate the proposed method using natural and medical images. Our experiments with the MVTec AD dataset show that a model trained to localize NSA anomalies generalizes well to detecting real-world a priori unknown types of manufacturing defects. Our method achieves an overall detection AUROC of 97.2 outperforming all previous methods that learn without the use of additional datasets. Code available at https://github.com/hmsch/natural-synthetic-anomalies.

Anomaly detection is nowadays increasingly used in industrial applications and processes. One of the main fields of the appliance is the visual inspection for surface anomaly detection, which aims to spot regions that deviate from regularity and consequently identify abnormal products. Defect localization is a key task, that usually is achieved using a basic comparison between generated image and the original one, implementing some blob-analysis or image-editing algorithms, in the post-processing step, which is very biased towards the source dataset, and they are unable to generalize. Furthermore, in industrial applications, the totality of the image is not always interesting but could be one or some regions of interest (ROIs), where only in those areas there are relevant anomalies to be spotted. For these reasons, we propose a new architecture composed by two blocks. The first block is a Generative Adversarial Network (GAN), based on a residual autoencoder (ResAE), to perform reconstruction and denoising processes, while the second block produces image segmentation, spotting defects. This method learns from a dataset composed of good products and generated synthetic defects. The discriminative network is trained using a ROI for each image contained in the training dataset. The network will learn in which area anomalies are relevant. This approach guarantees the reduction of using pre-processing algorithms, formerly developed with blob-analysis and image-editing procedures. To test our model we used challenging MVTec anomaly detection datasets and an industrial large dataset of pharmaceutical BFS strips of vials. This set constitutes a more realistic use case of the aforementioned network.

Anomaly detection (AD) is essential for industrial inspection, yet existing methods typically rely on ``comparing'' test images to normal references from a training set. However, variations in appearance and positioning often complicate the alignment of these references with the test image, limiting detection accuracy. We observe that most anomalies manifest as local variations, meaning that even within anomalous images, valuable normal information remains. We argue that this information is useful and may be more aligned with the anomalies since both the anomalies and the normal information originate from the same image. Therefore, rather than relying on external normality from the training set, we propose INP-Former, a novel method that extracts Intrinsic Normal Prototypes (INPs) directly from the test image. Specifically, we introduce the INP Extractor, which linearly combines normal tokens to represent INPs. We further propose an INP Coherence Loss to ensure INPs can faithfully represent normality for the testing image. These INPs then guide the INP-Guided Decoder to reconstruct only normal tokens, with reconstruction errors serving as anomaly scores. Additionally, we propose a Soft Mining Loss to prioritize hard-to-optimize samples during training. INP-Former achieves state-of-the-art performance in single-class, multi-class, and few-shot AD tasks across MVTec-AD, VisA, and Real-IAD, positioning it as a versatile and universal solution for AD. Remarkably, INP-Former also demonstrates some zero-shot AD capability. Code is available at:https://github.com/luow23/INP-Former.

Visual recognition models are prone to learning spurious correlations induced by a biased training set where certain conditions B (\eg, Indoors) are over-represented in certain classes Y (\eg, Big Dogs). Synthetic data from off-the-shelf large-scale generative models offers a promising direction to mitigate this issue by augmenting underrepresented subgroups in the real dataset. However, by using a mixed distribution of real and synthetic data, we introduce another source of bias due to distributional differences between synthetic and real data (\eg synthetic artifacts). As we will show, prior work's approach for using synthetic data to resolve the model's bias toward B do not correct the model's bias toward the pair (B, G), where G denotes whether the sample is real or synthetic. Thus, the model could simply learn signals based on the pair (B, G) (\eg, Synthetic Indoors) to make predictions about Y (\eg, Big Dogs). To address this issue, we propose a simple, easy-to-implement, two-step training pipeline that we call From Fake to Real (FFR). The first step of FFR pre-trains a model on balanced synthetic data to learn robust representations across subgroups. In the second step, FFR fine-tunes the model on real data using ERM or common loss-based bias mitigation methods. By training on real and synthetic data separately, FFR does not expose the model to the statistical differences between real and synthetic data and thus avoids the issue of bias toward the pair (B, G). Our experiments show that FFR improves worst group accuracy over the state-of-the-art by up to 20\% over three datasets. Code available: https://github.com/mqraitem/From-Fake-to-Real

Surface defects are a primary source of yield loss in manufacturing, yet existing anomaly detection methods often fail in real-world deployment due to limited and unrepresentative datasets. To overcome this, we introduce 3D-ADAM, a 3D Anomaly Detection in Additive Manufacturing dataset, that is the first large-scale, industry-relevant dataset for RGB+3D surface defect detection in additive manufacturing. 3D-ADAM comprises 14,120 high-resolution scans of 217 unique parts, captured with four industrial depth sensors, and includes 27,346 annotated defects across 12 categories along with 27,346 annotations of machine element features in 16 classes. 3D-ADAM is captured in a real industrial environment and as such reflects real production conditions, including variations in part placement, sensor positioning, lighting, and partial occlusion. Benchmarking state-of-the-art models demonstrates that 3D-ADAM presents substantial challenges beyond existing datasets. Validation through expert labelling surveys with industry partners further confirms its industrial relevance. By providing this benchmark, 3D-ADAM establishes a foundation for advancing robust 3D anomaly detection capable of meeting manufacturing demands.

Anomaly detection is the task of identifying examples that do not behave as expected. Because anomalies are rare and unexpected events, collecting real anomalous examples is often challenging in several applications. In addition, learning an anomaly detector with limited (or no) anomalies often yields poor prediction performance. One option is to employ auxiliary synthetic anomalies to improve the model training. However, synthetic anomalies may be of poor quality: anomalies that are unrealistic or indistinguishable from normal samples may deteriorate the detector's performance. Unfortunately, no existing methods quantify the quality of auxiliary anomalies. We fill in this gap and propose the expected anomaly posterior (EAP), an uncertainty-based score function that measures the quality of auxiliary anomalies by quantifying the total uncertainty of an anomaly detector. Experimentally on 40 benchmark datasets of images and tabular data, we show that EAP outperforms 12 adapted data quality estimators in the majority of cases.

To efficiently deploy strong, often pre-trained feature extractors, recent Industrial Anomaly Detection and Segmentation (IADS) methods process low-resolution images, e.g., 224x224 pixels, obtained by downsampling the original input images. However, while numerous industrial applications demand the identification of both large and small defects, downsampling the input image to a low resolution may hinder a method's ability to pinpoint tiny anomalies. We propose a novel Teacher--Student paradigm to leverage strong pre-trained features while processing high-resolution input images very efficiently. The core idea concerns training two shallow MLPs (the Students) by nominal images so as to mimic the mappings between the patch embeddings induced by the self-attention layers of a frozen vision Transformer (the Teacher). Indeed, learning these mappings sets forth a challenging pretext task that small-capacity models are unlikely to accomplish on out-of-distribution data such as anomalous images. Our method can spot anomalies from high-resolution images and runs way faster than competitors, achieving state-of-the-art performance on MVTec AD and the best segmentation results on VisA. We also propose novel evaluation metrics to capture robustness to defect size, i.e., the ability to preserve good localisation from large anomalies to tiny ones. Evaluating our method also by these metrics reveals its neatly superior performance.

Pavement defect detection faces critical challenges including limited annotated data, domain shift between training and deployment environments, and high variability in defect appearances across different road conditions. We propose RoadFusion, a framework that addresses these limitations through synthetic anomaly generation with dual-path feature adaptation. A latent diffusion model synthesizes diverse, realistic defects using text prompts and spatial masks, enabling effective training under data scarcity. Two separate feature adaptors specialize representations for normal and anomalous inputs, improving robustness to domain shift and defect variability. A lightweight discriminator learns to distinguish fine-grained defect patterns at the patch level. Evaluated on six benchmark datasets, RoadFusion achieves consistently strong performance across both classification and localization tasks, setting new state-of-the-art in multiple metrics relevant to real-world road inspection.

Precision in identifying nanometer-scale device-killer defects is crucial in both semiconductor research and development as well as in production processes. The effectiveness of existing ML-based approaches in this context is largely limited by the scarcity of data, as the production of real semiconductor wafer data for training these models involves high financial and time costs. Moreover, the existing simulation methods fall short of replicating images with identical noise characteristics, surface roughness and stochastic variations at advanced nodes. We propose a method for generating synthetic semiconductor SEM images using a diffusion model within a limited data regime. In contrast to images generated through conventional simulation methods, SEM images generated through our proposed DL method closely resemble real SEM images, replicating their noise characteristics and surface roughness adaptively. Our main contributions, which are validated on three different real semiconductor datasets, are: i) proposing a patch-based generative framework utilizing DDPM to create SEM images with intended defect classes, addressing challenges related to class-imbalance and data insufficiency, ii) demonstrating generated synthetic images closely resemble real SEM images acquired from the tool, preserving all imaging conditions and metrology characteristics without any metadata supervision, iii) demonstrating a defect detector trained on generated defect dataset, either independently or combined with a limited real dataset, can achieve similar or improved performance on real wafer SEM images during validation/testing compared to exclusive training on a real defect dataset, iv) demonstrating the ability of the proposed approach to transfer defect types, critical dimensions, and imaging conditions from one specified CD/Pitch and metrology specifications to another, thereby highlighting its versatility.

Anomaly detection is a practical and challenging task due to the scarcity of anomaly samples in industrial inspection. Some existing anomaly detection methods address this issue by synthesizing anomalies with noise or external data. However, there is always a large semantic gap between synthetic and real-world anomalies, resulting in weak performance in anomaly detection. To solve the problem, we propose a few-shot Anomaly-driven Generation (AnoGen) method, which guides the diffusion model to generate realistic and diverse anomalies with only a few real anomalies, thereby benefiting training anomaly detection models. Specifically, our work is divided into three stages. In the first stage, we learn the anomaly distribution based on a few given real anomalies and inject the learned knowledge into an embedding. In the second stage, we use the embedding and given bounding boxes to guide the diffusion model to generate realistic and diverse anomalies on specific objects (or textures). In the final stage, we propose a weakly-supervised anomaly detection method to train a more powerful model with generated anomalies. Our method builds upon DRAEM and DesTSeg as the foundation model and conducts experiments on the commonly used industrial anomaly detection dataset, MVTec. The experiments demonstrate that our generated anomalies effectively improve the model performance of both anomaly classification and segmentation tasks simultaneously, \eg, DRAEM and DseTSeg achieved a 5.8\% and 1.5\% improvement in AU-PR metric on segmentation task, respectively. The code and generated anomalous data are available at https://github.com/gaobb/AnoGen.

Existing defect/anomaly generation methods often rely on few-shot learning, which overfits to specific defect categories due to the lack of large-scale paired defect editing data. This issue is aggravated by substantial variations in defect scale and morphology, resulting in limited generalization, degraded realism, and category consistency. We address these challenges by introducing UDG, a large-scale dataset of 300K normal-abnormal-mask-caption quadruplets spanning diverse domains, and by presenting UniDG, a universal defect generation foundation model that supports both reference-based defect generation and text instruction-based defect editing without per-category fine-tuning. UniDG performs Defect-Context Editing via adaptive defect cropping and structured diptych input format, and fuses reference and target conditions through MM-DiT multimodal attention. A two-stage training strategy, Diversity-SFT followed by Consistency-RFT, further improves diversity while enhancing realism and reference consistency. Extensive experiments on MVTec-AD and VisA show that UniDG outperforms prior few-shot anomaly generation and image insertion/editing baselines in synthesis quality and downstream single- and multi-class anomaly detection/localization. Code will be available at https://github.com/RetoFan233/UniDG.

We present IMDD-1M, the first large-scale Industrial Multimodal Defect Dataset comprising 1,000,000 aligned image-text pairs, designed to advance multimodal learning for manufacturing and quality inspection. IMDD-1M contains high-resolution real-world defects spanning over 60 material categories and more than 400 defect types, each accompanied by expert-verified annotations and fine-grained textual descriptions detailing defect location, severity, and contextual attributes. This dataset enables a wide spectrum of applications, including classification, segmentation, retrieval, captioning, and generative modeling. Building upon IMDD-1M, we train a diffusion-based vision-language foundation model from scratch, specifically tailored for industrial scenarios. The model serves as a generalizable foundation that can be efficiently adapted to specialized domains through lightweight fine-tuning. With less than 5% of the task-specific data required by dedicated expert models, it achieves comparable performance, highlighting the potential of data-efficient foundation model adaptation for industrial inspection and generation, paving the way for scalable, domain-adaptive, and knowledge-grounded manufacturing intelligence.

A crucial requirement for reliable deployment of deep learning models for safety-critical applications is the ability to identify out-of-distribution (OOD) data points, samples which differ from the training data and on which a model might underperform. Previous work has attempted to tackle this problem using uncertainty estimation techniques. However, there is empirical evidence that a large family of these techniques do not detect OOD reliably in classification tasks. This paper gives a theoretical explanation for said experimental findings and illustrates it on synthetic data. We prove that such techniques are not able to reliably identify OOD samples in a classification setting, since their level of confidence is generalized to unseen areas of the feature space. This result stems from the interplay between the representation of ReLU networks as piece-wise affine transformations, the saturating nature of activation functions like softmax, and the most widely-used uncertainty metrics.

Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial for determining the root cause of production defects, which may further provide insight for yield improvement in wafer foundry. During manufacturing, various defects may appear standalone in the wafer or may appear as different combinations. Identifying multiple defects in a wafer is generally harder compared to identifying a single defect. Recently, deep learning methods have gained significant traction in mixed-type DPR. However, the complexity of defects requires complex and large models making them very difficult to operate on low-memory embedded devices typically used in fabrication labs. Another common issue is the unavailability of labeled data to train complex networks. In this work, we propose an unsupervised training routine to distill the knowledge of complex pre-trained models to lightweight deployment-ready models. We empirically show that this type of training compresses the model without sacrificing accuracy despite being up to 10 times smaller than the teacher model. The compressed model also manages to outperform contemporary state-of-the-art models.

Reliable anomaly detection in photovoltaic (PV) modules is critical for maintaining solar energy efficiency. However, developing robust computer vision models for PV inspection is constrained by the scarcity of large-scale, diverse, and balanced datasets. This study introduces PV-DDPM, a spatially conditioned denoising diffusion probabilistic model that generates anomalous electroluminescence (EL) images across four PV cell types: multi-crystalline silicon (multi-c-Si), mono-crystalline silicon (mono-c-Si), half-cut multi-c-Si, and interdigitated back contact (IBC) with dogbone interconnect. PV-DDPM enables controlled synthesis of single-defect and multi-defect scenarios by conditioning on binary masks representing structural features and defect positions. To the best of our knowledge, this is the first framework that jointly models multiple PV cell types while supporting simultaneous generation of diverse anomaly types. We also introduce E-SCDD, an enhanced version of the SCDD dataset, comprising 1,000 pixel-wise annotated EL images spanning 30 semantic classes, and 1,768 unlabeled synthetic samples. Quantitative evaluation shows our generated images achieve a Fréchet Inception Distance (FID) of 4.10 and Kernel Inception Distance (KID) of 0.0023 pm 0.0007 across all categories. Training the vision--language anomaly detection model AA-CLIP on E-SCDD, compared to the SCDD dataset, improves pixel-level AUC and average precision by 1.70 and 8.34 points, respectively.

Although recent methods have tried to introduce large multimodal models (LMMs) into industrial anomaly detection (IAD), their generalization in the IAD field is far inferior to that for general purposes. We summarize the main reasons for this gap into two aspects. On one hand, general-purpose LMMs lack cognition of defects in the visual modality, thereby failing to sufficiently focus on defect areas. Therefore, we propose to modify the AnyRes structure of the LLaVA model, providing the potential anomalous areas identified by existing IAD models to the LMMs. On the other hand, existing methods mainly focus on identifying defects by learning defect patterns or comparing with normal samples, yet they fall short of understanding the causes of these defects. Considering that the generation of defects is closely related to the manufacturing process, we propose a manufacturing-driven IAD paradigm. An instruction-tuning dataset for IAD (InstructIAD) and a data organization approach for Chain-of-Thought with manufacturing (CoT-M) are designed to leverage the manufacturing process for IAD. Based on the above two modifications, we present Triad, a novel LMM-based method incorporating an expert-guided region-of-interest tokenizer and manufacturing process for industrial anomaly detection. Extensive experiments show that our Triad not only demonstrates competitive performance against current LMMs but also achieves further improved accuracy when equipped with manufacturing processes. Source code, training data, and pre-trained models will be publicly available at https://github.com/tzjtatata/Triad.

The chips contained in any electronic device are manufactured over circular silicon wafers, which are monitored by inspection machines at different production stages. Inspection machines detect and locate any defect within the wafer and return a Wafer Defect Map (WDM), i.e., a list of the coordinates where defects lie, which can be considered a huge, sparse, and binary image. In normal conditions, wafers exhibit a small number of randomly distributed defects, while defects grouped in specific patterns might indicate known or novel categories of failures in the production line. Needless to say, a primary concern of semiconductor industries is to identify these patterns and intervene as soon as possible to restore normal production conditions. Here we address WDM monitoring as an open-set recognition problem to accurately classify WDM in known categories and promptly detect novel patterns. In particular, we propose a comprehensive pipeline for wafer monitoring based on a Submanifold Sparse Convolutional Network, a deep architecture designed to process sparse data at an arbitrary resolution, which is trained on the known classes. To detect novelties, we define an outlier detector based on a Gaussian Mixture Model fitted on the latent representation of the classifier. Our experiments on a real dataset of WDMs show that directly processing full-resolution WDMs by Submanifold Sparse Convolutions yields superior classification performance on known classes than traditional Convolutional Neural Networks, which require a preliminary binning to reduce the size of the binary images representing WDMs. Moreover, our solution outperforms state-of-the-art open-set recognition solutions in detecting novelties.

Precise optical inspection in industrial applications is crucial for minimizing scrap rates and reducing the associated costs. Besides merely detecting if a product is anomalous or not, it is crucial to know the distinct type of defect, such as a bent, cut, or scratch. The ability to recognize the "exact" defect type enables automated treatments of the anomalies in modern production lines. Current methods are limited to solely detecting whether a product is defective or not without providing any insights on the defect type, nevertheless detecting and identifying multiple defects. We propose MultiADS, a zero-shot learning approach, able to perform Multi-type Anomaly Detection and Segmentation. The architecture of MultiADS comprises CLIP and extra linear layers to align the visual- and textual representation in a joint feature space. To the best of our knowledge, our proposal, is the first approach to perform a multi-type anomaly segmentation task in zero-shot learning. Contrary to the other baselines, our approach i) generates specific anomaly masks for each distinct defect type, ii) learns to distinguish defect types, and iii) simultaneously identifies multiple defect types present in an anomalous product. Additionally, our approach outperforms zero/few-shot learning SoTA methods on image-level and pixel-level anomaly detection and segmentation tasks on five commonly used datasets: MVTec-AD, Visa, MPDD, MAD and Real-IAD.

As the globalization of semiconductor design and manufacturing processes continues, the demand for defect detection during integrated circuit fabrication stages is becoming increasingly critical, playing a significant role in enhancing the yield of semiconductor products. Traditional wafer map defect pattern detection methods involve manual inspection using electron microscopes to collect sample images, which are then assessed by experts for defects. This approach is labor-intensive and inefficient. Consequently, there is a pressing need to develop a model capable of automatically detecting defects as an alternative to manual operations. In this paper, we propose a method that initially employs a pre-trained VAE model to obtain the fault distribution information of the wafer map. This information serves as guidance, combined with the original image set for semi-supervised model training. During the semi-supervised training, we utilize a teacher-student network for iterative learning. The model presented in this paper is validated on the benchmark dataset WM-811K wafer dataset. The experimental results demonstrate superior classification accuracy and detection performance compared to state-of-the-art models, fulfilling the requirements for industrial applications. Compared to the original architecture, we have achieved significant performance improvement.

Industrial visual inspection in pharmaceutical production requires high accuracy under strict constraints on cycle time, hardware footprint, and operational cost. Manual inline inspection is still common, but it is affected by operator variability and limited throughput. Classical rule-based computer vision pipelines are often rigid and difficult to scale to highly variable production scenarios. To address these limitations, we present a semi-supervised anomaly detection framework based on a generative adversarial architecture with a residual autoencoder and a dense bottleneck, specifically designed for online deployment on a high-speed Blow-Fill-Seal (BFS) line. The model is trained only on nominal samples and detects anomalies through reconstruction residuals, providing both classification and spatial localization via heatmaps. The training set contains 2,815,200 grayscale patches. Experiments on a real industrial test kit show high detection performance while satisfying timing constraints compatible with a 500 ms acquisition slot.

Anomaly inspection plays a vital role in industrial manufacturing, but the scarcity of anomaly samples significantly limits the effectiveness of existing methods in tasks such as localization and classification. While several anomaly synthesis approaches have been introduced for data augmentation, they often struggle with low realism, inaccurate mask alignment, and poor generalization. To overcome these limitations, we propose Generate Aligned Anomaly (GAA), a region-guided, few-shot anomaly image-mask pair generation framework. GAA leverages the strong priors of a pretrained latent diffusion model to generate realistic, diverse, and semantically aligned anomalies using only a small number of samples. The framework first employs Localized Concept Decomposition to jointly model the semantic features and spatial information of anomalies, enabling flexible control over the type and location of anomalies. It then utilizes Adaptive Multi-Round Anomaly Clustering to perform fine-grained semantic clustering of anomaly concepts, thereby enhancing the consistency of anomaly representations. Subsequently, a region-guided mask generation strategy ensures precise alignment between anomalies and their corresponding masks, while a low-quality sample filtering module is introduced to further improve the overall quality of the generated samples. Extensive experiments on the MVTec AD and LOCO datasets demonstrate that GAA achieves superior performance in both anomaly synthesis quality and downstream tasks such as localization and classification.

Being able to spot defective parts is a critical component in large-scale industrial manufacturing. A particular challenge that we address in this work is the cold-start problem: fit a model using nominal (non-defective) example images only. While handcrafted solutions per class are possible, the goal is to build systems that work well simultaneously on many different tasks automatically. The best performing approaches combine embeddings from ImageNet models with an outlier detection model. In this paper, we extend on this line of work and propose PatchCore, which uses a maximally representative memory bank of nominal patch-features. PatchCore offers competitive inference times while achieving state-of-the-art performance for both detection and localization. On the challenging, widely used MVTec AD benchmark PatchCore achieves an image-level anomaly detection AUROC score of up to 99.6%, more than halving the error compared to the next best competitor. We further report competitive results on two additional datasets and also find competitive results in the few samples regime.^* Work done during a research internship at Amazon AWS. Code: github.com/amazon-research/patchcore-inspection.

Chest X-rays (CXR) are the most common medical imaging study and are used to diagnose multiple medical conditions. This study examines the impact of synthetic data supplementation, using diffusion models, on the performance of deep learning (DL) classifiers for CXR analysis. We employed three datasets: CheXpert, MIMIC-CXR, and Emory Chest X-ray, training conditional denoising diffusion probabilistic models (DDPMs) to generate synthetic frontal radiographs. Our approach ensured that synthetic images mirrored the demographic and pathological traits of the original data. Evaluating the classifiers' performance on internal and external datasets revealed that synthetic data supplementation enhances model accuracy, particularly in detecting less prevalent pathologies. Furthermore, models trained on synthetic data alone approached the performance of those trained on real data. This suggests that synthetic data can potentially compensate for real data shortages in training robust DL models. However, despite promising outcomes, the superiority of real data persists.

Anomaly detection (AD) is a crucial machine learning task that aims to learn patterns from a set of normal training samples to identify abnormal samples in test data. Most existing AD studies assume that the training and test data are drawn from the same data distribution, but the test data can have large distribution shifts arising in many real-world applications due to different natural variations such as new lighting conditions, object poses, or background appearances, rendering existing AD methods ineffective in such cases. In this paper, we consider the problem of anomaly detection under distribution shift and establish performance benchmarks on three widely-used AD and out-of-distribution (OOD) generalization datasets. We demonstrate that simple adaptation of state-of-the-art OOD generalization methods to AD settings fails to work effectively due to the lack of labeled anomaly data. We further introduce a novel robust AD approach to diverse distribution shifts by minimizing the distribution gap between in-distribution and OOD normal samples in both the training and inference stages in an unsupervised way. Our extensive empirical results on the three datasets show that our approach substantially outperforms state-of-the-art AD methods and OOD generalization methods on data with various distribution shifts, while maintaining the detection accuracy on in-distribution data.

Mechanical defects in real situations affect observation values and cause abnormalities in multivariate time series, such as sensor values or network data. To perceive abnormalities in such data, it is crucial to understand the temporal context and interrelation between variables simultaneously. The anomaly detection task for time series, especially for unlabeled data, has been a challenging problem, and we address it by applying a suitable data degradation scheme to self-supervised model training. We define four types of synthetic outliers and propose the degradation scheme in which a portion of input data is replaced with one of the synthetic outliers. Inspired by the self-attention mechanism, we design a Transformer-based architecture to recognize the temporal context and detect unnatural sequences with high efficiency. Our model converts multivariate data points into temporal representations with relative position bias and yields anomaly scores from these representations. Our method, AnomalyBERT, shows a great capability of detecting anomalies contained in complex time series and surpasses previous state-of-the-art methods on five real-world benchmarks. Our code is available at https://github.com/Jhryu30/AnomalyBERT.

An important challenge when using computer vision models in the real world is to evaluate their performance in potential out-of-distribution (OOD) scenarios. While simple synthetic corruptions are commonly applied to test OOD robustness, they often fail to capture nuisance shifts that occur in the real world. Recently, diffusion models have been applied to generate realistic images for benchmarking, but they are restricted to binary nuisance shifts. In this work, we introduce CNS-Bench, a Continuous Nuisance Shift Benchmark to quantify OOD robustness of image classifiers for continuous and realistic generative nuisance shifts. CNS-Bench allows generating a wide range of individual nuisance shifts in continuous severities by applying LoRA adapters to diffusion models. To address failure cases, we propose a filtering mechanism that outperforms previous methods, thereby enabling reliable benchmarking with generative models. With the proposed benchmark, we perform a large-scale study to evaluate the robustness of more than 40 classifiers under various nuisance shifts. Through carefully designed comparisons and analyses, we find that model rankings can change for varying shifts and shift scales, which cannot be captured when applying common binary shifts. Additionally, we show that evaluating the model performance on a continuous scale allows the identification of model failure points, providing a more nuanced understanding of model robustness. Project page including code and data: https://genintel.github.io/CNS.

In this paper, we explore a novel approach to 3D anomaly detection (AD) that goes beyond merely identifying anomalies based on structural characteristics. Our primary perspective is that most anomalies arise from unpredictable defective forces originating from both internal and external sources. To address these anomalies, we seek out opposing forces that can help correct them. Therefore, we introduce the Mechanics Complementary Model-based Framework for the 3D-AD task (MC4AD), which generates internal and external corrective forces for each point. We first propose a Diverse Anomaly-Generation (DA-Gen) module designed to simulate various types of anomalies. Next, we present the Corrective Force Prediction Network (CFP-Net), which uses complementary representations for point-level analysis to simulate the different contributions from internal and external corrective forces. To ensure the corrective forces are constrained effectively, we have developed a combined loss function that includes a new symmetric loss and an overall loss. Notably, we implement a Hierarchical Quality Control (HQC) strategy based on a three-way decision process and contribute a dataset titled Anomaly-IntraVariance, which incorporates intraclass variance to evaluate our model. As a result, the proposed MC4AD has been proven effective through theory and experimentation. The experimental results demonstrate that our approach yields nine state-of-the-art performances, achieving optimal results with minimal parameters and the fastest inference speed across five existing datasets, in addition to the proposed Anomaly-IntraVariance dataset. The source is available at https://github.com/hzzzzzhappy/MC4AD

Low-quality or scarce data has posed significant challenges for training deep neural networks in practice. While classical data augmentation cannot contribute very different new data, diffusion models opens up a new door to build self-evolving AI by generating high-quality and diverse synthetic data through text-guided prompts. However, text-only guidance cannot control synthetic images' proximity to the original images, resulting in out-of-distribution data detrimental to the model performance. To overcome the limitation, we study image guidance to achieve a spectrum of interpolations between synthetic and real images. With stronger image guidance, the generated images are similar to the training data but hard to learn. While with weaker image guidance, the synthetic images will be easier for model but contribute to a larger distribution gap with the original data. The generated full spectrum of data enables us to build a novel "Diffusion Curriculum (DisCL)". DisCL adjusts the image guidance level of image synthesis for each training stage: It identifies and focuses on hard samples for the model and assesses the most effective guidance level of synthetic images to improve hard data learning. We apply DisCL to two challenging tasks: long-tail (LT) classification and learning from low-quality data. It focuses on lower-guidance images of high-quality to learn prototypical features as a warm-up of learning higher-guidance images that might be weak on diversity or quality. Extensive experiments showcase a gain of 2.7% and 2.1% in OOD and ID macro-accuracy when applying DisCL to iWildCam dataset. On ImageNet-LT, DisCL improves the base model's tail-class accuracy from 4.4% to 23.64% and leads to a 4.02% improvement in all-class accuracy.

The out-of-distribution (OOD) problem generally arises when neural networks encounter data that significantly deviates from the training data distribution, i.e., in-distribution (InD). In this paper, we study the OOD problem from a neuron activation view. We first formulate neuron activation states by considering both the neuron output and its influence on model decisions. Then, to characterize the relationship between neurons and OOD issues, we introduce the neuron activation coverage (NAC) -- a simple measure for neuron behaviors under InD data. Leveraging our NAC, we show that 1) InD and OOD inputs can be largely separated based on the neuron behavior, which significantly eases the OOD detection problem and beats the 21 previous methods over three benchmarks (CIFAR-10, CIFAR-100, and ImageNet-1K). 2) a positive correlation between NAC and model generalization ability consistently holds across architectures and datasets, which enables a NAC-based criterion for evaluating model robustness. Compared to prevalent InD validation criteria, we show that NAC not only can select more robust models, but also has a stronger correlation with OOD test performance.

Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial to find the root cause of the issue and further improving the yield in the wafer foundry. Mixed-type DPR is much more complicated compared to single-type DPR due to varied spatial features, the uncertainty of defects, and the number of defects present. To accurately predict the number of defects as well as the types of defects, we propose a novel compact deformable convolutional transformer (DC Transformer). Specifically, DC Transformer focuses on the global features present in the wafer map by virtue of learnable deformable kernels and multi-head attention to the global features. The proposed method succinctly models the internal relationship between the wafer maps and the defects. DC Transformer is evaluated on a real dataset containing 38 defect patterns. Experimental results show that DC Transformer performs exceptionally well in recognizing both single and mixed-type defects. The proposed method outperforms the current state of the models by a considerable margin

Distinguishing in- and out-of-distribution (OOD) inputs is crucial for reliable deployment of classification systems. However, OOD data is typically unavailable or difficult to collect, posing a significant challenge for accurate OOD detection. In this work, we present a method that harnesses the generative capabilities of Large Language Models (LLMs) to create high-quality synthetic OOD proxies, eliminating the dependency on any external OOD data source. We study the efficacy of our method on classical text classification tasks such as toxicity detection and sentiment classification as well as classification tasks arising in LLM development and deployment, such as training a reward model for RLHF and detecting misaligned generations. Extensive experiments on nine InD-OOD dataset pairs and various model sizes show that our approach dramatically lowers false positive rates (achieving a perfect zero in some cases) while maintaining high accuracy on in-distribution tasks, outperforming baseline methods by a significant margin.

Synthetic data generation with Large Language Models is a promising paradigm for augmenting natural data over a nearly infinite range of tasks. Given this variety, direct comparisons among synthetic data generation algorithms are scarce, making it difficult to understand where improvement comes from and what bottlenecks exist. We propose to evaluate algorithms via the makeup of synthetic data generated by each algorithm in terms of data quality, diversity, and complexity. We choose these three characteristics for their significance in open-ended processes and the impact each has on the capabilities of downstream models. We find quality to be essential for in-distribution model generalization, diversity to be essential for out-of-distribution generalization, and complexity to be beneficial for both. Further, we emphasize the existence of Quality-Diversity trade-offs in training data and the downstream effects on model performance. We then examine the effect of various components in the synthetic data pipeline on each data characteristic. This examination allows us to taxonomize and compare synthetic data generation algorithms through the components they utilize and the resulting effects on data QDC composition. This analysis extends into a discussion on the importance of balancing QDC in synthetic data for efficient reinforcement learning and self-improvement algorithms. Analogous to the QD trade-offs in training data, often there exist trade-offs between model output quality and output diversity which impact the composition of synthetic data. We observe that many models are currently evaluated and optimized only for output quality, thereby limiting output diversity and the potential for self-improvement. We argue that balancing these trade-offs is essential to the development of future self-improvement algorithms and highlight a number of works making progress in this direction.

Generative models have had a profound impact on vision and language, paving the way for a new era of multimodal generative applications. While these successes have inspired researchers to explore using generative models in science and engineering to accelerate the design process and reduce the reliance on iterative optimization, challenges remain. Specifically, engineering optimization methods based on physics still outperform generative models when dealing with constrained environments where data is scarce and precision is paramount. To address these challenges, we introduce Diffusion Optimization Models (DOM) and Trajectory Alignment (TA), a learning framework that demonstrates the efficacy of aligning the sampling trajectory of diffusion models with the optimization trajectory derived from traditional physics-based methods. This alignment ensures that the sampling process remains grounded in the underlying physical principles. Our method allows for generating feasible and high-performance designs in as few as two steps without the need for expensive preprocessing, external surrogate models, or additional labeled data. We apply our framework to structural topology optimization, a fundamental problem in mechanical design, evaluating its performance on in- and out-of-distribution configurations. Our results demonstrate that TA outperforms state-of-the-art deep generative models on in-distribution configurations and halves the inference computational cost. When coupled with a few steps of optimization, it also improves manufacturability for out-of-distribution conditions. By significantly improving performance and inference efficiency, DOM enables us to generate high-quality designs in just a few steps and guide them toward regions of high performance and manufacturability, paving the way for the widespread application of generative models in large-scale data-driven design.

The artificial intelligence (AI) world is running out of real data for training increasingly large generative models, resulting in accelerating pressure to train on synthetic data. Unfortunately, training new generative models with synthetic data from current or past generation models creates an autophagous (self-consuming) loop that degrades the quality and/or diversity of the synthetic data in what has been termed model autophagy disorder (MAD) and model collapse. Current thinking around model autophagy recommends that synthetic data is to be avoided for model training lest the system deteriorate into MADness. In this paper, we take a different tack that treats synthetic data differently from real data. Self-IMproving diffusion models with Synthetic data (SIMS) is a new training concept for diffusion models that uses self-synthesized data to provide negative guidance during the generation process to steer a model's generative process away from the non-ideal synthetic data manifold and towards the real data distribution. We demonstrate that SIMS is capable of self-improvement; it establishes new records based on the Fr\'echet inception distance (FID) metric for CIFAR-10 and ImageNet-64 generation and achieves competitive results on FFHQ-64 and ImageNet-512. Moreover, SIMS is, to the best of our knowledge, the first prophylactic generative AI algorithm that can be iteratively trained on self-generated synthetic data without going MAD. As a bonus, SIMS can adjust a diffusion model's synthetic data distribution to match any desired in-domain target distribution to help mitigate biases and ensure fairness.

In many real-world applications, deployed models encounter inputs that differ from the data seen during training. Out-of-distribution detection identifies whether an input stems from an unseen distribution, while open-world recognition flags such inputs to ensure the system remains robust as ever-emerging, previously unknown categories appear and must be addressed without retraining. Foundation and vision-language models are pre-trained on large and diverse datasets with the expectation of broad generalization across domains, including medical imaging. However, benchmarking these models on test sets with only a few common outlier types silently collapses the evaluation back to a closed-set problem, masking failures on rare or truly novel conditions encountered in clinical use. We therefore present NOVA, a challenging, real-life evaluation-only benchmark of sim900 brain MRI scans that span 281 rare pathologies and heterogeneous acquisition protocols. Each case includes rich clinical narratives and double-blinded expert bounding-box annotations. Together, these enable joint assessment of anomaly localisation, visual captioning, and diagnostic reasoning. Because NOVA is never used for training, it serves as an extreme stress-test of out-of-distribution generalisation: models must bridge a distribution gap both in sample appearance and in semantic space. Baseline results with leading vision-language models (GPT-4o, Gemini 2.0 Flash, and Qwen2.5-VL-72B) reveal substantial performance drops across all tasks, establishing NOVA as a rigorous testbed for advancing models that can detect, localize, and reason about truly unknown anomalies.

Conformal prediction is a framework for predictive inference with a distribution-free, finite-sample guarantee. However, it tends to provide uninformative prediction sets when calibration data are scarce. This paper introduces Synthetic-powered predictive inference (SPI), a novel framework that incorporates synthetic data -- e.g., from a generative model -- to improve sample efficiency. At the core of our method is a score transporter: an empirical quantile mapping that aligns nonconformity scores from trusted, real data with those from synthetic data. By carefully integrating the score transporter into the calibration process, SPI provably achieves finite-sample coverage guarantees without making any assumptions about the real and synthetic data distributions. When the score distributions are well aligned, SPI yields substantially tighter and more informative prediction sets than standard conformal prediction. Experiments on image classification -- augmenting data with synthetic diffusion-model generated images -- and on tabular regression demonstrate notable improvements in predictive efficiency in data-scarce settings.

We aim at constructing a high performance model for defect detection that detects unknown anomalous patterns of an image without anomalous data. To this end, we propose a two-stage framework for building anomaly detectors using normal training data only. We first learn self-supervised deep representations and then build a generative one-class classifier on learned representations. We learn representations by classifying normal data from the CutPaste, a simple data augmentation strategy that cuts an image patch and pastes at a random location of a large image. Our empirical study on MVTec anomaly detection dataset demonstrates the proposed algorithm is general to be able to detect various types of real-world defects. We bring the improvement upon previous arts by 3.1 AUCs when learning representations from scratch. By transfer learning on pretrained representations on ImageNet, we achieve a new state-of-theart 96.6 AUC. Lastly, we extend the framework to learn and extract representations from patches to allow localizing defective areas without annotations during training.

Despite the remarkable success, recent reconstruction-based anomaly detection (AD) methods via diffusion modeling still involve fine-grained noise-strength tuning and computationally expensive multi-step denoising, leading to a fundamental tension between fidelity and efficiency. In this paper, we propose InvAD, a novel inversion-based anomaly detection approach ("detection via noising in latent space") that circumvents explicit reconstruction. Importantly, we contend that the limitations in prior reconstruction-based methods originate from the prevailing "detection via denoising in RGB space" paradigm. To address this, we model AD under a reconstruction-free formulation, which directly infers the final latent variable corresponding to the input image via DDIM inversion, and then measures the deviation based on the known prior distribution for anomaly scoring. Specifically, in approximating the original probability flow ODE using the Euler method, we enforce only a few inversion steps to noise the clean image to pursue inference efficiency. As the added noise is adaptively derived with the learned diffusion model, the original features for the clean testing image can still be leveraged to yield high detection accuracy. We perform extensive experiments and detailed analyses across four widely used industrial and medical AD benchmarks under the unsupervised unified setting to demonstrate the effectiveness of our model, achieving state-of-the-art AD performance and approximately 2x inference-time speedup without diffusion distillation.

Identifying Out-of-distribution (OOD) data is becoming increasingly critical as the real-world applications of deep learning methods expand. Post-hoc methods modify softmax scores fine-tuned on outlier data or leverage intermediate feature layers to identify distinctive patterns between In-Distribution (ID) and OOD samples. Other methods focus on employing diverse OOD samples to learn discrepancies between ID and OOD. These techniques, however, are typically dependent on the quality of the outlier samples assumed. Density-based methods explicitly model class-conditioned distributions but this requires long training time or retraining the classifier. To tackle these issues, we introduce FlowCon, a new density-based OOD detection technique. Our main innovation lies in efficiently combining the properties of normalizing flow with supervised contrastive learning, ensuring robust representation learning with tractable density estimation. Empirical evaluation shows the enhanced performance of our method across common vision datasets such as CIFAR-10 and CIFAR-100 pretrained on ResNet18 and WideResNet classifiers. We also perform quantitative analysis using likelihood plots and qualitative visualization using UMAP embeddings and demonstrate the robustness of the proposed method under various OOD contexts. Code will be open-sourced post decision.

Despite diffusion models' superior capabilities in modeling complex distributions, there are still non-trivial distributional discrepancies between generated and ground-truth images, which has resulted in several notable problems in image generation, including missing object errors in text-to-image generation and low image quality. Existing methods that attempt to address these problems mostly do not tend to address the fundamental cause behind these problems, which is the distributional discrepancies, and hence achieve sub-optimal results. In this paper, we propose a particle filtering framework that can effectively address both problems by explicitly reducing the distributional discrepancies. Specifically, our method relies on a set of external guidance, including a small set of real images and a pre-trained object detector, to gauge the distribution gap, and then design the resampling weight accordingly to correct the gap. Experiments show that our methods can effectively correct missing object errors and improve image quality in various image generation tasks. Notably, our method outperforms the existing strongest baseline by 5% in object occurrence and 1.0 in FID on MS-COCO. Our code is publicly available at https://github.com/UCSB-NLP-Chang/diffusion_resampling.git.

Spatial control is a core capability in controllable image generation. Advancements in layout-guided image generation have shown promising results on in-distribution (ID) datasets with similar spatial configurations. However, it is unclear how these models perform when facing out-of-distribution (OOD) samples with arbitrary, unseen layouts. In this paper, we propose LayoutBench, a diagnostic benchmark for layout-guided image generation that examines four categories of spatial control skills: number, position, size, and shape. We benchmark two recent representative layout-guided image generation methods and observe that the good ID layout control may not generalize well to arbitrary layouts in the wild (e.g., objects at the boundary). Next, we propose IterInpaint, a new baseline that generates foreground and background regions in a step-by-step manner via inpainting, demonstrating stronger generalizability than existing models on OOD layouts in LayoutBench. We perform quantitative and qualitative evaluation and fine-grained analysis on the four LayoutBench skills to pinpoint the weaknesses of existing models. Lastly, we show comprehensive ablation studies on IterInpaint, including training task ratio, crop&paste vs. repaint, and generation order. Project website: https://layoutbench.github.io

Industrial anomaly detection achieves progress thanks to datasets such as MVTec-AD and VisA. However, they suf- fer from limitations in terms of the number of defect sam- ples, types of defects, and availability of real-world scenes. These constraints inhibit researchers from further exploring the performance of industrial detection with higher accuracy. To this end, we propose a new large-scale anomaly detection dataset called 3CAD, which is derived from real 3C produc- tion lines. Specifically, the proposed 3CAD includes eight different types of manufactured parts, totaling 27,039 high- resolution images labeled with pixel-level anomalies. The key features of 3CAD are that it covers anomalous regions of different sizes, multiple anomaly types, and the possibility of multiple anomalous regions and multiple anomaly types per anomaly image. This is the largest and first anomaly de- tection dataset dedicated to 3C product quality control for community exploration and development. Meanwhile, we in- troduce a simple yet effective framework for unsupervised anomaly detection: a Coarse-to-Fine detection paradigm with Recovery Guidance (CFRG). To detect small defect anoma- lies, the proposed CFRG utilizes a coarse-to-fine detection paradigm. Specifically, we utilize a heterogeneous distilla- tion model for coarse localization and then fine localiza- tion through a segmentation model. In addition, to better capture normal patterns, we introduce recovery features as guidance. Finally, we report the results of our CFRG frame- work and popular anomaly detection methods on the 3CAD dataset, demonstrating strong competitiveness and providing a highly challenging benchmark to promote the development of the anomaly detection field. Data and code are available: https://github.com/EnquanYang2022/3CAD.

Anomaly detection is a crucial process in industrial manufacturing and has made significant advancements recently. However, there is a large variance between the data used in the development and the data collected by the production environment. Therefore, we present the Texture-AD benchmark based on representative texture-based anomaly detection to evaluate the effectiveness of unsupervised anomaly detection algorithms in real-world applications. This dataset includes images of 15 different cloth, 14 semiconductor wafers and 10 metal plates acquired under different optical schemes. In addition, it includes more than 10 different types of defects produced during real manufacturing processes, such as scratches, wrinkles, color variations and point defects, which are often more difficult to detect than existing datasets. All anomalous areas are provided with pixel-level annotations to facilitate comprehensive evaluation using anomaly detection models. Specifically, to adapt to diverse products in automated pipelines, we present a new evaluation method and results of baseline algorithms. The experimental results show that Texture-AD is a difficult challenge for state-of-the-art algorithms. To our knowledge, Texture-AD is the first dataset to be devoted to evaluating industrial defect detection algorithms in the real world. The dataset is available at https://XXX.

Reliable machine learning and statistical analysis rely on diverse, well-distributed training data. However, real-world datasets are often limited in size and exhibit underrepresentation across key subpopulations, leading to biased predictions and reduced performance, particularly in supervised tasks such as classification. To address these challenges, we propose Conditional Data Synthesis Augmentation (CoDSA), a novel framework that leverages generative models, such as diffusion models, to synthesize high-fidelity data for improving model performance across multimodal domains including tabular, textual, and image data. CoDSA generates synthetic samples that faithfully capture the conditional distributions of the original data, with a focus on under-sampled or high-interest regions. Through transfer learning, CoDSA fine-tunes pre-trained generative models to enhance the realism of synthetic data and increase sample density in sparse areas. This process preserves inter-modal relationships, mitigates data imbalance, improves domain adaptation, and boosts generalization. We also introduce a theoretical framework that quantifies the statistical accuracy improvements enabled by CoDSA as a function of synthetic sample volume and targeted region allocation, providing formal guarantees of its effectiveness. Extensive experiments demonstrate that CoDSA consistently outperforms non-adaptive augmentation strategies and state-of-the-art baselines in both supervised and unsupervised settings.

We propose a simple and application-friendly network (called SimpleNet) for detecting and localizing anomalies. SimpleNet consists of four components: (1) a pre-trained Feature Extractor that generates local features, (2) a shallow Feature Adapter that transfers local features towards target domain, (3) a simple Anomaly Feature Generator that counterfeits anomaly features by adding Gaussian noise to normal features, and (4) a binary Anomaly Discriminator that distinguishes anomaly features from normal features. During inference, the Anomaly Feature Generator would be discarded. Our approach is based on three intuitions. First, transforming pre-trained features to target-oriented features helps avoid domain bias. Second, generating synthetic anomalies in feature space is more effective, as defects may not have much commonality in the image space. Third, a simple discriminator is much efficient and practical. In spite of simplicity, SimpleNet outperforms previous methods quantitatively and qualitatively. On the MVTec AD benchmark, SimpleNet achieves an anomaly detection AUROC of 99.6%, reducing the error by 55.5% compared to the next best performing model. Furthermore, SimpleNet is faster than existing methods, with a high frame rate of 77 FPS on a 3080ti GPU. Additionally, SimpleNet demonstrates significant improvements in performance on the One-Class Novelty Detection task. Code: https://github.com/DonaldRR/SimpleNet.

Detecting out-of-distribution (OOD) samples in medical imaging plays an important role for downstream medical diagnosis. However, existing OOD detectors are demonstrated on natural images composed of inter-classes and have difficulty generalizing to medical images. The key issue is the granularity of OOD data in the medical domain, where intra-class OOD samples are predominant. We focus on the generalizability of OOD detection for medical images and propose a self-supervised Cascade Variational autoencoder-based Anomaly Detector (CVAD). We use a variational autoencoders' cascade architecture, which combines latent representation at multiple scales, before being fed to a discriminator to distinguish the OOD data from the in-distribution (ID) data. Finally, both the reconstruction error and the OOD probability predicted by the binary discriminator are used to determine the anomalies. We compare the performance with the state-of-the-art deep learning models to demonstrate our model's efficacy on various open-access medical imaging datasets for both intra- and inter-class OOD. Further extensive results on datasets including common natural datasets show our model's effectiveness and generalizability. The code is available at https://github.com/XiaoyuanGuo/CVAD.

Generating realistic synthetic microscopy images is critical for training deep learning models in label-scarce environments, such as cell counting with many cells per image. However, traditional domain adaptation methods often struggle to bridge the domain gap when synthetic images lack the complex textures and visual patterns of real samples. In this work, we adapt the Inversion-Based Style Transfer (InST) framework originally designed for artistic style transfer to biomedical microscopy images. Our method combines latent-space Adaptive Instance Normalization with stochastic inversion in a diffusion model to transfer the style from real fluorescence microscopy images to synthetic ones, while weakly preserving content structure. We evaluate the effectiveness of our InST-based synthetic dataset for downstream cell counting by pre-training and fine-tuning EfficientNet-B0 models on various data sources, including real data, hard-coded synthetic data, and the public Cell200-s dataset. Models trained with our InST-synthesized images achieve up to 37\% lower Mean Absolute Error (MAE) compared to models trained on hard-coded synthetic data, and a 52\% reduction in MAE compared to models trained on Cell200-s (from 53.70 to 25.95 MAE). Notably, our approach also outperforms models trained on real data alone (25.95 vs. 27.74 MAE). Further improvements are achieved when combining InST-synthesized data with lightweight domain adaptation techniques such as DACS with CutMix. These findings demonstrate that InST-based style transfer most effectively reduces the domain gap between synthetic and real microscopy data. Our approach offers a scalable path for enhancing cell counting performance while minimizing manual labeling effort. The source code and resources are publicly available at: https://github.com/MohammadDehghan/InST-Microscopy.

Out-of-distribution (OOD) detection is crucial to modern deep learning applications by identifying and alerting about the OOD samples that should not be tested or used for making predictions. Current OOD detection methods have made significant progress when in-distribution (ID) and OOD samples are drawn from static distributions. However, this can be unrealistic when applied to real-world systems which often undergo continuous variations and shifts in ID and OOD distributions over time. Therefore, for an effective application in real-world systems, the development of OOD detection methods that can adapt to these dynamic and evolving distributions is essential. In this paper, we propose a novel and more realistic setting called continuously adaptive out-of-distribution (CAOOD) detection which targets on developing an OOD detection model that enables dynamic and quick adaptation to a new arriving distribution, with insufficient ID samples during deployment time. To address CAOOD, we develop meta OOD learning (MOL) by designing a learning-to-adapt diagram such that a good initialized OOD detection model is learned during the training process. In the testing process, MOL ensures OOD detection performance over shifting distributions by quickly adapting to new distributions with a few adaptations. Extensive experiments on several OOD benchmarks endorse the effectiveness of our method in preserving both ID classification accuracy and OOD detection performance on continuously shifting distributions.

In industrial anomaly detection (IAD), accurately identifying defects amidst diverse anomalies and under varying imaging conditions remains a significant challenge. Traditional approaches often struggle with high false-positive rates, frequently misclassifying normal shadows and surface deformations as defects, an issue that becomes particularly pronounced in products with complex and intricate surface features. To address these challenges, we introduce PA-CLIP, a zero-shot anomaly detection method that reduces background noise and enhances defect detection through a pseudo-anomaly-based framework. The proposed method integrates a multiscale feature aggregation strategy for capturing detailed global and local information, two memory banks for distinguishing background information, including normal patterns and pseudo-anomalies, from true anomaly features, and a decision-making module designed to minimize false positives caused by environmental variations while maintaining high defect sensitivity. Demonstrated on the MVTec AD and VisA datasets, PA-CLIP outperforms existing zero-shot methods, providing a robust solution for industrial defect detection.

We introduce SeaS, a unified industrial generative model for automatically creating diverse anomalies, authentic normal products, and precise anomaly masks. While extensive research exists, most efforts either focus on specific tasks, i.e., anomalies or normal products only, or require separate models for each anomaly type. Consequently, prior methods either offer limited generative capability or depend on a vast array of anomaly-specific models. We demonstrate that U-Net's differentiated learning ability captures the distinct visual traits of slightly-varied normal products and diverse anomalies, enabling us to construct a unified model for all tasks. Specifically, we first introduce an Unbalanced Abnormal (UA) Text Prompt, comprising one normal token and multiple anomaly tokens. More importantly, our Decoupled Anomaly Alignment (DA) loss decouples anomaly attributes and binds them to distinct anomaly tokens of UA, enabling SeaS to create unseen anomalies by recombining these attributes. Furthermore, our Normal-image Alignment (NA) loss aligns the normal token to normal patterns, making generated normal products globally consistent and locally varied. Finally, SeaS produces accurate anomaly masks by fusing discriminative U-Net features with high-resolution VAE features. SeaS sets a new benchmark for industrial generation, significantly enhancing downstream applications, with average improvements of +8.66% pixel-level AP for synthesis-based AD approaches, +1.10% image-level AP for unsupervised AD methods, and +12.79% IoU for supervised segmentation models. Code is available at https://github.com/HUST-SLOW/SeaS{https://github.com/HUST-SLOW/SeaS}.

Unsupervised reconstruction networks using self-attention transformers have achieved state-of-the-art performance for multi-class (unified) anomaly detection with a single model. However, these self-attention reconstruction models primarily operate on target features, which may result in perfect reconstruction for both normal and anomaly features due to high consistency with context, leading to failure in detecting anomalies. Additionally, these models often produce inaccurate anomaly segmentation due to performing reconstruction in a low spatial resolution latent space. To enable reconstruction models enjoying high efficiency while enhancing their generalization for unified anomaly detection, we propose a simple yet effective method that reconstructs normal features and restores anomaly features with just One Normal Image Prompt (OneNIP). In contrast to previous work, OneNIP allows for the first time to reconstruct or restore anomalies with just one normal image prompt, effectively boosting unified anomaly detection performance. Furthermore, we propose a supervised refiner that regresses reconstruction errors by using both real normal and synthesized anomalous images, which significantly improves pixel-level anomaly segmentation. OneNIP outperforms previous methods on three industry anomaly detection benchmarks: MVTec, BTAD, and VisA. The code and pre-trained models are available at https://github.com/gaobb/OneNIP.

Because anomalous samples cannot be used for training, many anomaly detection and localization methods use pre-trained networks and non-parametric modeling to estimate encoded feature distribution. However, these methods neglect the impact of position and neighborhood information on the distribution of normal features. To overcome this, we propose a new algorithm, PNI, which estimates the normal distribution using conditional probability given neighborhood features, modeled with a multi-layer perceptron network. Moreover, position information is utilized by creating a histogram of representative features at each position. Instead of simply resizing the anomaly map, the proposed method employs an additional refine network trained on synthetic anomaly images to better interpolate and account for the shape and edge of the input image. We conducted experiments on the MVTec AD benchmark dataset and achieved state-of-the-art performance, with 99.56\% and 98.98\% AUROC scores in anomaly detection and localization, respectively.

Conditioning image generation facilitates seamless editing and the creation of photorealistic images. However, conditioning on noisy or Out-of-Distribution (OoD) images poses significant challenges, particularly in balancing fidelity to the input and realism of the output. We introduce Confident Ordinary Differential Editing (CODE), a novel approach for image synthesis that effectively handles OoD guidance images. Utilizing a diffusion model as a generative prior, CODE enhances images through score-based updates along the probability-flow Ordinary Differential Equation (ODE) trajectory. This method requires no task-specific training, no handcrafted modules, and no assumptions regarding the corruptions affecting the conditioning image. Our method is compatible with any diffusion model. Positioned at the intersection of conditional image generation and blind image restoration, CODE operates in a fully blind manner, relying solely on a pre-trained generative model. Our method introduces an alternative approach to blind restoration: instead of targeting a specific ground truth image based on assumptions about the underlying corruption, CODE aims to increase the likelihood of the input image while maintaining fidelity. This results in the most probable in-distribution image around the input. Our contributions are twofold. First, CODE introduces a novel editing method based on ODE, providing enhanced control, realism, and fidelity compared to its SDE-based counterpart. Second, we introduce a confidence interval-based clipping method, which improves CODE's effectiveness by allowing it to disregard certain pixels or information, thus enhancing the restoration process in a blind manner. Experimental results demonstrate CODE's effectiveness over existing methods, particularly in scenarios involving severe degradation or OoD inputs.

Anomaly detection in industrial visual inspection is challenging due to the scarcity of defective samples. Most existing methods rely on unsupervised reconstruction using only normal data, often resulting in overfitting and poor detection of subtle defects. We propose a semi-supervised deep reinforcement learning framework that integrates a neural batch sampler, an autoencoder, and a predictor. The RL-based sampler adaptively selects informative patches by balancing exploration and exploitation through a composite reward. The autoencoder generates loss profiles highlighting abnormal regions, while the predictor performs segmentation in the loss-profile space. This interaction enables the system to effectively learn both normal and defective patterns with limited labeled data. Experiments on the MVTec AD dataset demonstrate that our method achieves higher accuracy and better localization of subtle anomalies than recent state-of-the-art approaches while maintaining low complexity, yielding an average improvement of 0.15 in F1_max and 0.06 in AUC, with a maximum gain of 0.37 in F1_max in the best case.

Data collection is often difficult in critical fields such as medicine, physics, and chemistry. As a result, classification methods usually perform poorly with these small datasets, leading to weak predictive performance. Increasing the training set with additional synthetic data, similar to data augmentation in images, is commonly believed to improve downstream classification performance. However, current tabular generative methods that learn either the joint distribution p(x, y) or the class-conditional distribution p(x mid y) often overfit on small datasets, resulting in poor-quality synthetic data, usually worsening classification performance compared to using real data alone. To solve these challenges, we introduce TabEBM, a novel class-conditional generative method using Energy-Based Models (EBMs). Unlike existing methods that use a shared model to approximate all class-conditional densities, our key innovation is to create distinct EBM generative models for each class, each modelling its class-specific data distribution individually. This approach creates robust energy landscapes, even in ambiguous class distributions. Our experiments show that TabEBM generates synthetic data with higher quality and better statistical fidelity than existing methods. When used for data augmentation, our synthetic data consistently improves the classification performance across diverse datasets of various sizes, especially small ones. Code is available at https://github.com/andreimargeloiu/TabEBM.

Recent studies have shown that higher accuracy on ImageNet usually leads to better robustness against different corruptions. Therefore, in this paper, instead of following the traditional research paradigm that investigates new out-of-distribution corruptions or perturbations deep models may encounter, we conduct model debugging in in-distribution data to explore which object attributes a model may be sensitive to. To achieve this goal, we create a toolkit for object editing with controls of backgrounds, sizes, positions, and directions, and create a rigorous benchmark named ImageNet-E(diting) for evaluating the image classifier robustness in terms of object attributes. With our ImageNet-E, we evaluate the performance of current deep learning models, including both convolutional neural networks and vision transformers. We find that most models are quite sensitive to attribute changes. A small change in the background can lead to an average of 9.23\% drop on top-1 accuracy. We also evaluate some robust models including both adversarially trained models and other robust trained models and find that some models show worse robustness against attribute changes than vanilla models. Based on these findings, we discover ways to enhance attribute robustness with preprocessing, architecture designs, and training strategies. We hope this work can provide some insights to the community and open up a new avenue for research in robust computer vision. The code and dataset are available at https://github.com/alibaba/easyrobust.

Out-of-distribution (OOD) detection aims to identify OOD inputs from unknown classes, which is important for the reliable deployment of machine learning models in the open world. Various scoring functions are proposed to distinguish it from in-distribution (ID) data. However, existing methods generally focus on excavating the discriminative information from a single input, which implicitly limits its representation dimension. In this work, we introduce a novel perspective, i.e., employing different common corruptions on the input space, to expand that. We reveal an interesting phenomenon termed confidence mutation, where the confidence of OOD data can decrease significantly under the corruptions, while the ID data shows a higher confidence expectation considering the resistance of semantic features. Based on that, we formalize a new scoring method, namely, Confidence aVerage (CoVer), which can capture the dynamic differences by simply averaging the scores obtained from different corrupted inputs and the original ones, making the OOD and ID distributions more separable in detection tasks. Extensive experiments and analyses have been conducted to understand and verify the effectiveness of CoVer. The code is publicly available at: https://github.com/tmlr-group/CoVer.

Deep learning-based models for All-In-One Image Restoration (AIOR) have achieved significant advancements in recent years. However, their practical applicability is limited by poor generalization to samples outside the training distribution. This limitation arises primarily from insufficient diversity in degradation variations and scenes within existing datasets, resulting in inadequate representations of real-world scenarios. Additionally, capturing large-scale real-world paired data for degradations such as haze, low-light, and raindrops is often cumbersome and sometimes infeasible. In this paper, we leverage the generative capabilities of latent diffusion models to synthesize high-quality degraded images from their clean counterparts. Specifically, we introduce GenDeg, a degradation and intensity-aware conditional diffusion model capable of producing diverse degradation patterns on clean images. Using GenDeg, we synthesize over 550k samples across six degradation types: haze, rain, snow, motion blur, low-light, and raindrops. These generated samples are integrated with existing datasets to form the GenDS dataset, comprising over 750k samples. Our experiments reveal that image restoration models trained on the GenDS dataset exhibit significant improvements in out-of-distribution performance compared to those trained solely on existing datasets. Furthermore, we provide comprehensive analyses on the implications of diffusion model-based synthetic degradations for AIOR. The code will be made publicly available.

Modern Deep Learning (DL) architectures based on transformers (e.g., BERT, RoBERTa) are exhibiting performance improvements across a number of natural language tasks. While such DL models have shown tremendous potential for use in software engineering applications, they are often hampered by insufficient training data. Particularly constrained are applications that require project-specific data, such as bug localization, which aims at recommending code to fix a newly submitted bug report. Deep learning models for bug localization require a substantial training set of fixed bug reports, which are at a limited quantity even in popular and actively developed software projects. In this paper, we examine the effect of using synthetic training data on transformer-based DL models that perform a more complex variant of bug localization, which has the goal of retrieving bug-inducing changesets for each bug report. To generate high-quality synthetic data, we propose novel data augmentation operators that act on different constituent components of bug reports. We also describe a data balancing strategy that aims to create a corpus of augmented bug reports that better reflects the entire source code base, because existing bug reports used as training data usually reference a small part of the code base.

Recent advances in diffusion models have enabled the creation of deceptively real images, posing significant security risks when misused. In this study, we empirically show that different timesteps of DDIM inversion reveal varying subtle distinctions between synthetic and real images that are extractable for detection, in the forms of such as Fourier power spectrum high-frequency discrepancies and inter-pixel variance distributions. Based on these observations, we propose a novel synthetic image detection method that directly utilizes features of intermediately noised images by training an ensemble on multiple noised timesteps, circumventing conventional reconstruction-based strategies. To enhance human comprehension, we introduce a metric-grounded explanation generation and refinement module to identify and explain AI-generated flaws. Additionally, we construct the GenHard and GenExplain benchmarks to provide detection samples of greater difficulty and high-quality rationales for fake images. Extensive experiments show that our method achieves state-of-the-art performance with 98.91% and 95.89% detection accuracy on regular and challenging samples respectively, and demonstrates generalizability and robustness. Our code and datasets are available at https://github.com/Shadowlized/ESIDE.

The core of out-of-distribution (OOD) detection is to learn the in-distribution (ID) representation, which is distinguishable from OOD samples. Previous work applied recognition-based methods to learn the ID features, which tend to learn shortcuts instead of comprehensive representations. In this work, we find surprisingly that simply using reconstruction-based methods could boost the performance of OOD detection significantly. We deeply explore the main contributors of OOD detection and find that reconstruction-based pretext tasks have the potential to provide a generally applicable and efficacious prior, which benefits the model in learning intrinsic data distributions of the ID dataset. Specifically, we take Masked Image Modeling as a pretext task for our OOD detection framework (MOOD). Without bells and whistles, MOOD outperforms previous SOTA of one-class OOD detection by 5.7%, multi-class OOD detection by 3.0%, and near-distribution OOD detection by 2.1%. It even defeats the 10-shot-per-class outlier exposure OOD detection, although we do not include any OOD samples for our detection

With recent generative models facilitating photo-realistic image synthesis, the proliferation of synthetic images has also engendered certain negative impacts on social platforms, thereby raising an urgent imperative to develop effective detectors. Current synthetic image detection (SID) pipelines are primarily dedicated to crafting universal artifact features, accompanied by an oversight about SID training paradigm. In this paper, we re-examine the SID problem and identify two prevalent biases in current training paradigms, i.e., weakened artifact features and overfitted artifact features. Meanwhile, we discover that the imaging mechanism of synthetic images contributes to heightened local correlations among pixels, suggesting that detectors should be equipped with local awareness. In this light, we propose SAFE, a lightweight and effective detector with three simple image transformations. Firstly, for weakened artifact features, we substitute the down-sampling operator with the crop operator in image pre-processing to help circumvent artifact distortion. Secondly, for overfitted artifact features, we include ColorJitter and RandomRotation as additional data augmentations, to help alleviate irrelevant biases from color discrepancies and semantic differences in limited training samples. Thirdly, for local awareness, we propose a patch-based random masking strategy tailored for SID, forcing the detector to focus on local regions at training. Comparative experiments are conducted on an open-world dataset, comprising synthetic images generated by 26 distinct generative models. Our pipeline achieves a new state-of-the-art performance, with remarkable improvements of 4.5% in accuracy and 2.9% in average precision against existing methods. Our code is available at: https://github.com/Ouxiang-Li/SAFE.

Diffusion models have achieved remarkable success in generating realistic images but suffer from generating accurate human hands, such as incorrect finger counts or irregular shapes. This difficulty arises from the complex task of learning the physical structure and pose of hands from training images, which involves extensive deformations and occlusions. For correct hand generation, our paper introduces a lightweight post-processing solution called HandRefiner. HandRefiner employs a conditional inpainting approach to rectify malformed hands while leaving other parts of the image untouched. We leverage the hand mesh reconstruction model that consistently adheres to the correct number of fingers and hand shape, while also being capable of fitting the desired hand pose in the generated image. Given a generated failed image due to malformed hands, we utilize ControlNet modules to re-inject such correct hand information. Additionally, we uncover a phase transition phenomenon within ControlNet as we vary the control strength. It enables us to take advantage of more readily available synthetic data without suffering from the domain gap between realistic and synthetic hands. Experiments demonstrate that HandRefiner can significantly improve the generation quality quantitatively and qualitatively. The code is available at https://github.com/wenquanlu/HandRefiner .

Modern deep learning-based inpainting enables realistic local image manipulation, raising critical challenges for reliable detection. However, we observe that current detectors primarily rely on global artifacts that appear as inpainting side effects, rather than on locally synthesized content. We show that this behavior occurs because VAE-based reconstruction induces a subtle but pervasive spectral shift across the entire image, including unedited regions. To isolate this effect, we introduce Inpainting Exchange (INP-X), an operation that restores original pixels outside the edited region while preserving all synthesized content. We create a 90K test dataset including real, inpainted, and exchanged images to evaluate this phenomenon. Under this intervention, pretrained state-of-the-art detectors, including commercial ones, exhibit a dramatic drop in accuracy (e.g., from 91\% to 55\%), frequently approaching chance level. We provide a theoretical analysis linking this behavior to high-frequency attenuation caused by VAE information bottlenecks. Our findings highlight the need for content-aware detection. Indeed, training on our dataset yields better generalization and localization than standard inpainting. Our dataset and code are publicly available at https://github.com/emirhanbilgic/INP-X.

We present a new framework for Patch Distribution Modeling, PaDiM, to concurrently detect and localize anomalies in images in a one-class learning setting. PaDiM makes use of a pretrained convolutional neural network (CNN) for patch embedding, and of multivariate Gaussian distributions to get a probabilistic representation of the normal class. It also exploits correlations between the different semantic levels of CNN to better localize anomalies. PaDiM outperforms current state-of-the-art approaches for both anomaly detection and localization on the MVTec AD and STC datasets. To match real-world visual industrial inspection, we extend the evaluation protocol to assess performance of anomaly localization algorithms on non-aligned dataset. The state-of-the-art performance and low complexity of PaDiM make it a good candidate for many industrial applications.

Achieving robust performance and fairness across diverse patient populations remains a challenge in developing clinically deployable deep learning models for diagnostic imaging. Synthetic data generation has emerged as a promising strategy to address limitations in dataset scale and diversity. We introduce RoentGen-v2, a text-to-image diffusion model for chest radiographs that enables fine-grained control over both radiographic findings and patient demographic attributes, including sex, age, and race/ethnicity. RoentGen-v2 is the first model to generate clinically plausible images with demographic conditioning, facilitating the creation of a large, demographically balanced synthetic dataset comprising over 565,000 images. We use this large synthetic dataset to evaluate optimal training pipelines for downstream disease classification models. In contrast to prior work that combines real and synthetic data naively, we propose an improved training strategy that leverages synthetic data for supervised pretraining, followed by fine-tuning on real data. Through extensive evaluation on over 137,000 chest radiographs from five institutions, we demonstrate that synthetic pretraining consistently improves model performance, generalization to out-of-distribution settings, and fairness across demographic subgroups. Across datasets, synthetic pretraining led to a 6.5% accuracy increase in the performance of downstream classification models, compared to a modest 2.7% increase when naively combining real and synthetic data. We observe this performance improvement simultaneously with the reduction of the underdiagnosis fairness gap by 19.3%. These results highlight the potential of synthetic imaging to advance equitable and generalizable medical deep learning under real-world data constraints. We open source our code, trained models, and synthetic dataset at https://github.com/StanfordMIMI/RoentGen-v2 .

During industrial processing, unforeseen defects may arise in products due to uncontrollable factors. Although unsupervised methods have been successful in defect localization, the usual use of pre-trained models results in low-resolution outputs, which damages visual performance. To address this issue, we propose PyramidFlow, the first fully normalizing flow method without pre-trained models that enables high-resolution defect localization. Specifically, we propose a latent template-based defect contrastive localization paradigm to reduce intra-class variance, as the pre-trained models do. In addition, PyramidFlow utilizes pyramid-like normalizing flows for multi-scale fusing and volume normalization to help generalization. Our comprehensive studies on MVTecAD demonstrate the proposed method outperforms the comparable algorithms that do not use external priors, even achieving state-of-the-art performance in more challenging BTAD scenarios.

Efficiency and trustworthiness are two eternal pursuits when applying deep learning in real-world applications. With regard to efficiency, dataset distillation (DD) endeavors to reduce training costs by distilling the large dataset into a tiny synthetic dataset. However, existing methods merely concentrate on in-distribution (InD) classification in a closed-world setting, disregarding out-of-distribution (OOD) samples. On the other hand, OOD detection aims to enhance models' trustworthiness, which is always inefficiently achieved in full-data settings. For the first time, we simultaneously consider both issues and propose a novel paradigm called Trustworthy Dataset Distillation (TrustDD). By distilling both InD samples and outliers, the condensed datasets are capable of training models competent in both InD classification and OOD detection. To alleviate the requirement of real outlier data, we further propose to corrupt InD samples to generate pseudo-outliers, namely Pseudo-Outlier Exposure (POE). Comprehensive experiments on various settings demonstrate the effectiveness of TrustDD, and POE surpasses the state-of-the-art method Outlier Exposure (OE). Compared with the preceding DD, TrustDD is more trustworthy and applicable to open-world scenarios. Our code is available at https://github.com/mashijie1028/TrustDD

Unsupervised texture anomaly detection has been a concerning topic in a vast amount of industrial processes. Patterned textures inspection, particularly in the context of fabric defect detection, is indeed a widely encountered use case. This task involves handling a diverse spectrum of colors and textile types, encompassing a wide range of fabrics. Given the extensive variability in colors, textures, and defect types, fabric defect detection poses a complex and challenging problem in the field of patterned textures inspection. In this article, we propose a knowledge distillation-based approach tailored specifically for addressing the challenge of unsupervised anomaly detection in textures resembling fabrics. Our method aims to redefine the recently introduced reverse distillation approach, which advocates for an encoder-decoder design to mitigate classifier bias and to prevent the student from reconstructing anomalies. In this study, we present a new reverse distillation technique for the specific task of fabric defect detection. Our approach involves a meticulous design selection that strategically highlights high-level features. To demonstrate the capabilities of our approach both in terms of performance and inference speed, we conducted a series of experiments on multiple texture datasets, including MVTEC AD, AITEX, and TILDA, alongside conducting experiments on a dataset acquired from a textile manufacturing facility. The main contributions of this paper are the following: a robust texture anomaly detector utilizing a reverse knowledge-distillation technique suitable for both anomaly detection and domain generalization and a novel dataset encompassing a diverse range of fabrics and defects.

Modern machine learning models for scene understanding, such as depth estimation and object tracking, rely on large, high-quality datasets that mimic real-world deployment scenarios. To address data scarcity, we propose an end-to-end system for synthetic data generation for scalable, high-quality, and customizable 3D indoor scenes. By integrating and adapting text-to-image and multi-view diffusion models with Neural Radiance Field-based meshing, this system generates highfidelity 3D object assets from text prompts and incorporates them into pre-defined floor plans using a rendering tool. By introducing novel loss functions and training strategies into existing methods, the system supports on-demand scene generation, aiming to alleviate the scarcity of current available data, generally manually crafted by artists. This system advances the role of synthetic data in addressing machine learning training limitations, enabling more robust and generalizable models for real-world applications.

Out-of-distribution (OOD) detection is crucial for model reliability, as it identifies samples from unknown classes and reduces errors due to unexpected inputs. Vision-Language Models (VLMs) such as CLIP are emerging as powerful tools for OOD detection by integrating multi-modal information. However, the practical application of such systems is challenged by manual prompt engineering, which demands domain expertise and is sensitive to linguistic nuances. In this paper, we introduce Label-driven Automated Prompt Tuning (LAPT), a novel approach to OOD detection that reduces the need for manual prompt engineering. We develop distribution-aware prompts with in-distribution (ID) class names and negative labels mined automatically. Training samples linked to these class labels are collected autonomously via image synthesis and retrieval methods, allowing for prompt learning without manual effort. We utilize a simple cross-entropy loss for prompt optimization, with cross-modal and cross-distribution mixing strategies to reduce image noise and explore the intermediate space between distributions, respectively. The LAPT framework operates autonomously, requiring only ID class names as input and eliminating the need for manual intervention. With extensive experiments, LAPT consistently outperforms manually crafted prompts, setting a new standard for OOD detection. Moreover, LAPT not only enhances the distinction between ID and OOD samples, but also improves the ID classification accuracy and strengthens the generalization robustness to covariate shifts, resulting in outstanding performance in challenging full-spectrum OOD detection tasks. Codes are available at https://github.com/YBZh/LAPT.

Object perception is fundamental for tasks such as robotic material handling and quality inspection. However, modern supervised deep-learning perception models require large datasets for robust automation under semi-uncontrolled conditions. The cost of acquiring and annotating such data for proprietary parts is a major barrier for widespread deployment. In this context, we release SynthRender, an open source framework for synthetic image generation with Guided Domain Randomization capabilities. Furthermore, we benchmark recent Reality-to-Simulation techniques for 3D asset creation from 2D images of real parts. Combined with Domain Randomization, these synthetic assets provide low-overhead, transferable data even for parts lacking 3D files. We also introduce IRIS, the Industrial Real-Sim Imagery Set, containing 32 categories with diverse textures, intra-class variation, strong inter-class similarities and about 20,000 labels. Ablations on multiple benchmarks outline guidelines for efficient data generation with SynthRender. Our method surpasses existing approaches, achieving 99.1% mAP@50 on a public robotics dataset, 98.3% mAP@50 on an automotive benchmark, and 95.3% mAP@50 on IRIS.

Synthetic data generation is an important application of machine learning in the field of medical imaging. While existing approaches have successfully applied fine-tuned diffusion models for synthesizing medical images, we explore potential improvements to this pipeline through feature-aligned diffusion. Our approach aligns intermediate features of the diffusion model to the output features of an expert, and our preliminary findings show an improvement of 9% in generation accuracy and ~0.12 in SSIM diversity. Our approach is also synergistic with existing methods, and easily integrated into diffusion training pipelines for improvements. We make our code available at https://github.com/lnairGT/Feature-Aligned-Diffusion.

We present a transformer-based image anomaly detection and localization network. Our proposed model is a combination of a reconstruction-based approach and patch embedding. The use of transformer networks helps to preserve the spatial information of the embedded patches, which are later processed by a Gaussian mixture density network to localize the anomalous areas. In addition, we also publish BTAD, a real-world industrial anomaly dataset. Our results are compared with other state-of-the-art algorithms using publicly available datasets like MNIST and MVTec.

As deep neural networks become adopted in high-stakes domains, it is crucial to be able to identify when inference inputs are Out-of-Distribution (OOD) so that users can be alerted of likely drops in performance and calibration despite high confidence. Among many others, existing methods use the following two scores to do so without training on any apriori OOD examples: a learned temperature and an energy score. In this paper we introduce Ablated Learned Temperature Energy (or "AbeT" for short), a method which combines these prior methods in novel ways with effective modifications. Due to these contributions, AbeT lowers the False Positive Rate at 95% True Positive Rate (FPR@95) by 35.39% in classification (averaged across all ID and OOD datasets measured) compared to state of the art without training networks in multiple stages or requiring hyperparameters or test-time backward passes. We additionally provide empirical insights as to how our model learns to distinguish between In-Distribution (ID) and OOD samples while only being explicitly trained on ID samples via exposure to misclassified ID examples at training time. Lastly, we show the efficacy of our method in identifying predicted bounding boxes and pixels corresponding to OOD objects in object detection and semantic segmentation, respectively - with an AUROC increase of 5.15% in object detection and both a decrease in FPR@95 of 41.48% and an increase in AUPRC of 34.20% on average in semantic segmentation compared to previous state of the art.

Detecting surface anomalies of industrial materials poses a significant challenge within a myriad of industrial manufacturing processes. In recent times, various methodologies have emerged, capitalizing on the advantages of employing a network pre-trained on natural images for the extraction of representative features. Subsequently, these features are subjected to processing through a diverse range of techniques including memory banks, normalizing flow, and knowledge distillation, which have exhibited exceptional accuracy. This paper revisits approaches based on pre-trained features by introducing a novel method centered on target-specific embedding. To capture the most representative features of the texture under consideration, we employ a variant of a contrastive training procedure that incorporates both artificially generated defective samples and anomaly-free samples during training. Exploiting the intrinsic properties of surfaces, we derived a meaningful representation from the defect-free samples during training, facilitating a straightforward yet effective calculation of anomaly scores. The experiments conducted on the MVTEC AD and TILDA datasets demonstrate the competitiveness of our approach compared to state-of-the-art methods.

Industrial anomaly detection (IAD) has garnered significant attention and experienced rapid development. However, the recent development of IAD approach has encountered certain difficulties due to dataset limitations. On the one hand, most of the state-of-the-art methods have achieved saturation (over 99% in AUROC) on mainstream datasets such as MVTec, and the differences of methods cannot be well distinguished, leading to a significant gap between public datasets and actual application scenarios. On the other hand, the research on various new practical anomaly detection settings is limited by the scale of the dataset, posing a risk of overfitting in evaluation results. Therefore, we propose a large-scale, Real-world, and multi-view Industrial Anomaly Detection dataset, named Real-IAD, which contains 150K high-resolution images of 30 different objects, an order of magnitude larger than existing datasets. It has a larger range of defect area and ratio proportions, making it more challenging than previous datasets. To make the dataset closer to real application scenarios, we adopted a multi-view shooting method and proposed sample-level evaluation metrics. In addition, beyond the general unsupervised anomaly detection setting, we propose a new setting for Fully Unsupervised Industrial Anomaly Detection (FUIAD) based on the observation that the yield rate in industrial production is usually greater than 60%, which has more practical application value. Finally, we report the results of popular IAD methods on the Real-IAD dataset, providing a highly challenging benchmark to promote the development of the IAD field.

Scaling generative AI models is bottlenecked by the scarcity of high-quality training data. The ease of synthesizing from a generative model suggests using (unverified) synthetic data to augment a limited corpus of real data for the purpose of fine-tuning in the hope of improving performance. Unfortunately, however, the resulting positive feedback loop leads to model autophagy disorder (MAD, aka model collapse) that results in a rapid degradation in sample quality and/or diversity. In this paper, we introduce Neon (for Negative Extrapolation frOm self-traiNing), a new learning method that turns the degradation from self-training into a powerful signal for self-improvement. Given a base model, Neon first fine-tunes it on its own self-synthesized data but then, counterintuitively, reverses its gradient updates to extrapolate away from the degraded weights. We prove that Neon works because typical inference samplers that favor high-probability regions create a predictable anti-alignment between the synthetic and real data population gradients, which negative extrapolation corrects to better align the model with the true data distribution. Neon is remarkably easy to implement via a simple post-hoc merge that requires no new real data, works effectively with as few as 1k synthetic samples, and typically uses less than 1% additional training compute. We demonstrate Neon's universality across a range of architectures (diffusion, flow matching, autoregressive, and inductive moment matching models) and datasets (ImageNet, CIFAR-10, and FFHQ). In particular, on ImageNet 256x256, Neon elevates the xAR-L model to a new state-of-the-art FID of 1.02 with only 0.36% additional training compute. Code is available at https://github.com/SinaAlemohammad/Neon

Distribution shifts -- where the training distribution differs from the test distribution -- can substantially degrade the accuracy of machine learning (ML) systems deployed in the wild. Despite their ubiquity in the real-world deployments, these distribution shifts are under-represented in the datasets widely used in the ML community today. To address this gap, we present WILDS, a curated benchmark of 10 datasets reflecting a diverse range of distribution shifts that naturally arise in real-world applications, such as shifts across hospitals for tumor identification; across camera traps for wildlife monitoring; and across time and location in satellite imaging and poverty mapping. On each dataset, we show that standard training yields substantially lower out-of-distribution than in-distribution performance. This gap remains even with models trained by existing methods for tackling distribution shifts, underscoring the need for new methods for training models that are more robust to the types of distribution shifts that arise in practice. To facilitate method development, we provide an open-source package that automates dataset loading, contains default model architectures and hyperparameters, and standardizes evaluations. Code and leaderboards are available at https://wilds.stanford.edu.

Surface anomaly detection is a vital component in manufacturing inspection. Current discriminative methods follow a two-stage architecture composed of a reconstructive network followed by a discriminative network that relies on the reconstruction output. Currently used reconstructive networks often produce poor reconstructions that either still contain anomalies or lack details in anomaly-free regions. Discriminative methods are robust to some reconstructive network failures, suggesting that the discriminative network learns a strong normal appearance signal that the reconstructive networks miss. We reformulate the two-stage architecture into a single-stage iterative process that allows the exchange of information between the reconstruction and localization. We propose a novel transparency-based diffusion process where the transparency of anomalous regions is progressively increased, restoring their normal appearance accurately while maintaining the appearance of anomaly-free regions using localization cues of previous steps. We implement the proposed process as TRANSparency DifFUSION (TransFusion), a novel discriminative anomaly detection method that achieves state-of-the-art performance on both the VisA and the MVTec AD datasets, with an image-level AUROC of 98.5% and 99.2%, respectively. Code: https://github.com/MaticFuc/ECCV_TransFusion

Semantic segmentation of high-resolution remote-sensing imagery is critical for urban mapping and land-cover monitoring, yet training data typically exhibits severe long-tailed pixel imbalance. In the dataset LoveDA, this challenge is compounded by an explicit Urban/Rural split with distinct appearance and inconsistent class-frequency statistics across domains. We present a prompt-controlled diffusion augmentation framework that synthesizes paired label--image samples with explicit control of both domain and semantic composition. Stage~A uses a domain-aware, masked ratio-conditioned discrete diffusion model to generate layouts that satisfy user-specified class-ratio targets while respecting learned co-occurrence structure. Stage~B translates layouts into photorealistic, domain-consistent images using Stable Diffusion with ControlNet guidance. Mixing the resulting ratio and domain-controlled synthetic pairs with real data yields consistent improvements across multiple segmentation backbones, with gains concentrated on minority classes and improved Urban and Rural generalization, demonstrating controllable augmentation as a practical mechanism to mitigate long-tail bias in remote-sensing segmentation. Source codes, pretrained models, and synthetic datasets are available at https://github.com/Buddhi19/SyntheticGen.git{Github}

We introduce four new real-world distribution shift datasets consisting of changes in image style, image blurriness, geographic location, camera operation, and more. With our new datasets, we take stock of previously proposed methods for improving out-of-distribution robustness and put them to the test. We find that using larger models and artificial data augmentations can improve robustness on real-world distribution shifts, contrary to claims in prior work. We find improvements in artificial robustness benchmarks can transfer to real-world distribution shifts, contrary to claims in prior work. Motivated by our observation that data augmentations can help with real-world distribution shifts, we also introduce a new data augmentation method which advances the state-of-the-art and outperforms models pretrained with 1000 times more labeled data. Overall we find that some methods consistently help with distribution shifts in texture and local image statistics, but these methods do not help with some other distribution shifts like geographic changes. Our results show that future research must study multiple distribution shifts simultaneously, as we demonstrate that no evaluated method consistently improves robustness.

In many real-world scenarios, obtaining fully observed samples is prohibitively expensive or even infeasible, while partial and noisy observations are comparatively easy to collect. In this work, we study distribution restoration with abundant noisy samples, assuming the corruption process is available as a black-box generator. We show that this task can be framed as a one-sided entropic optimal transport problem and solved via an EM-like algorithm. We further provide a test criterion to determine whether the true underlying distribution is recoverable under per-sample information loss, and show that in otherwise unrecoverable cases, a small number of clean samples can render the distribution largely recoverable. Building on these insights, we introduce SFBD-OMNI, a bridge model-based framework that maps corrupted sample distributions to the ground-truth distribution. Our method generalizes Stochastic Forward-Backward Deconvolution (SFBD; Lu et al., 2025) to handle arbitrary measurement models beyond Gaussian corruption. Experiments across benchmark datasets and diverse measurement settings demonstrate significant improvements in both qualitative and quantitative performance.

Deep learning models are challenged by the distribution shift between the training data and test data. Recently, the large models pre-trained on diverse data have demonstrated unprecedented robustness to various distribution shifts. However, fine-tuning these models can lead to a trade-off between in-distribution (ID) performance and out-of-distribution (OOD) robustness. Existing methods for tackling this trade-off do not explicitly address the OOD robustness problem. In this paper, based on causal analysis of the aforementioned problems, we propose a novel fine-tuning method, which uses masked images as counterfactual samples that help improve the robustness of the fine-tuning model. Specifically, we mask either the semantics-related or semantics-unrelated patches of the images based on class activation map to break the spurious correlation, and refill the masked patches with patches from other images. The resulting counterfactual samples are used in feature-based distillation with the pre-trained model. Extensive experiments verify that regularizing the fine-tuning with the proposed masked images can achieve a better trade-off between ID and OOD performance, surpassing previous methods on the OOD performance. Our code is available at https://github.com/Coxy7/robust-finetuning.

Generating synthetic data through generative models is gaining interest in the ML community and beyond, promising a future where datasets can be tailored to individual needs. Unfortunately, synthetic data is usually not perfect, resulting in potential errors in downstream tasks. In this work we explore how the generative process affects the downstream ML task. We show that the naive synthetic data approach -- using synthetic data as if it is real -- leads to downstream models and analyses that do not generalize well to real data. As a first step towards better ML in the synthetic data regime, we introduce Deep Generative Ensemble (DGE) -- a framework inspired by Deep Ensembles that aims to implicitly approximate the posterior distribution over the generative process model parameters. DGE improves downstream model training, evaluation, and uncertainty quantification, vastly outperforming the naive approach on average. The largest improvements are achieved for minority classes and low-density regions of the original data, for which the generative uncertainty is largest.

Cardiovascular diseases (CVDs) remain the leading cause of mortality globally, and echocardiography is critical for diagnosis of both common and congenital cardiac conditions. However, echocardiographic data for certain pathologies are scarce, hindering the development of robust automated diagnosis models. In this work, we propose Echo-Path, a novel generative framework to produce echocardiogram videos conditioned on specific cardiac pathologies. Echo-Path can synthesize realistic ultrasound video sequences that exhibit targeted abnormalities, focusing here on atrial septal defect (ASD) and pulmonary arterial hypertension (PAH). Our approach introduces a pathology-conditioning mechanism into a state-of-the-art echo video generator, allowing the model to learn and control disease-specific structural and motion patterns in the heart. Quantitative evaluation demonstrates that the synthetic videos achieve low distribution distances, indicating high visual fidelity. Clinically, the generated echoes exhibit plausible pathology markers. Furthermore, classifiers trained on our synthetic data generalize well to real data and, when used to augment real training sets, it improves downstream diagnosis of ASD and PAH by 7\% and 8\% respectively. Code, weights and dataset are available here https://github.com/Marshall-mk/EchoPathv1

Realistic virtual humans play a crucial role in numerous industries, such as metaverse, intelligent healthcare, and self-driving simulation. But creating them on a large scale with high levels of realism remains a challenge. The utilization of deep implicit function sparks a new era of image-based 3D clothed human reconstruction, enabling pixel-aligned shape recovery with fine details. Subsequently, the vast majority of works locate the surface by regressing the deterministic implicit value for each point. However, should all points be treated equally regardless of their proximity to the surface? In this paper, we propose replacing the implicit value with an adaptive uncertainty distribution, to differentiate between points based on their distance to the surface. This simple ``value to distribution'' transition yields significant improvements on nearly all the baselines. Furthermore, qualitative results demonstrate that the models trained using our uncertainty distribution loss, can capture more intricate wrinkles, and realistic limbs. Code and models are available for research purposes at https://github.com/psyai-net/D-IF_release.

The sharp increase in data-related expenses has motivated research into condensing datasets while retaining the most informative features. Dataset distillation has thus recently come to the fore. This paradigm generates synthetic datasets that are representative enough to replace the original dataset in training a neural network. To avoid redundancy in these synthetic datasets, it is crucial that each element contains unique features and remains diverse from others during the synthesis stage. In this paper, we provide a thorough theoretical and empirical analysis of diversity within synthesized datasets. We argue that enhancing diversity can improve the parallelizable yet isolated synthesizing approach. Specifically, we introduce a novel method that employs dynamic and directed weight adjustment techniques to modulate the synthesis process, thereby maximizing the representativeness and diversity of each synthetic instance. Our method ensures that each batch of synthetic data mirrors the characteristics of a large, varying subset of the original dataset. Extensive experiments across multiple datasets, including CIFAR, Tiny-ImageNet, and ImageNet-1K, demonstrate the superior performance of our method, highlighting its effectiveness in producing diverse and representative synthetic datasets with minimal computational expense. Our code is available at https://github.com/AngusDujw/Diversity-Driven-Synthesis.https://github.com/AngusDujw/Diversity-Driven-Synthesis.

Recent advances in text-to-image (T2I) diffusion models have enabled increasingly realistic synthesis of vehicle damage, raising concerns about their reliability in automated insurance workflows. The ability to generate crash-like imagery challenges the boundary between authentic and synthetic data, introducing new risks of misuse in fraud or claim manipulation. To address these issues, we propose HERS (Hidden-Pattern Expert Learning for Risk-Specific Damage Adaptation), a framework designed to improve fidelity, controllability, and domain alignment of diffusion-generated damage images. HERS fine-tunes a base diffusion model via domain-specific expert adaptation without requiring manual annotation. Using self-supervised image-text pairs automatically generated by a large language model and T2I pipeline, HERS models each damage category, such as dents, scratches, broken lights, or cracked paint, as a separate expert. These experts are later integrated into a unified multi-damage model that balances specialization with generalization. We evaluate HERS across four diffusion backbones and observe consistent improvements: plus 5.5 percent in text faithfulness and plus 2.3 percent in human preference ratings compared to baselines. Beyond image fidelity, we discuss implications for fraud detection, auditability, and safe deployment of generative models in high-stakes domains. Our findings highlight both the opportunities and risks of domain-specific diffusion, underscoring the importance of trustworthy generation in safety-critical applications such as auto insurance.

Deep learning has become the state-of-the-art approach to medical tomographic imaging. A common approach is to feed the result of a simple inversion, for example the backprojection, to a multiscale convolutional neural network (CNN) which computes the final reconstruction. Despite good results on in-distribution test data, this often results in overfitting certain large-scale structures and poor generalization on out-of-distribution (OOD) samples. Moreover, the memory and computational complexity of multiscale CNNs scale unfavorably with image resolution, making them impractical for application at realistic clinical resolutions. In this paper, we introduce Glimpse, a local coordinate-based neural network for computed tomography which reconstructs a pixel value by processing only the measurements associated with the neighborhood of the pixel. Glimpse significantly outperforms successful CNNs on OOD samples, while achieving comparable or better performance on in-distribution test data and maintaining a memory footprint almost independent of image resolution; 5GB memory suffices to train on 1024x1024 images which is orders of magnitude less than CNNs. Glimpse is fully differentiable and can be used plug-and-play in arbitrary deep learning architectures, enabling feats such as correcting miscalibrated projection orientations. Our implementation and Google Colab demo can be accessed at https://github.com/swing-research/Glimpse.

Machine learning models frequently experience performance drops under distribution shifts. The underlying cause of such shifts may be multiple simultaneous factors such as changes in data quality, differences in specific covariate distributions, or changes in the relationship between label and features. When a model does fail during deployment, attributing performance change to these factors is critical for the model developer to identify the root cause and take mitigating actions. In this work, we introduce the problem of attributing performance differences between environments to distribution shifts in the underlying data generating mechanisms. We formulate the problem as a cooperative game where the players are distributions. We define the value of a set of distributions to be the change in model performance when only this set of distributions has changed between environments, and derive an importance weighting method for computing the value of an arbitrary set of distributions. The contribution of each distribution to the total performance change is then quantified as its Shapley value. We demonstrate the correctness and utility of our method on synthetic, semi-synthetic, and real-world case studies, showing its effectiveness in attributing performance changes to a wide range of distribution shifts.

Recent advances in computer vision have shown promising results in image generation. Diffusion probabilistic models in particular have generated realistic images from textual input, as demonstrated by DALL-E 2, Imagen and Stable Diffusion. However, their use in medicine, where image data typically comprises three-dimensional volumes, has not been systematically evaluated. Synthetic images may play a crucial role in privacy preserving artificial intelligence and can also be used to augment small datasets. Here we show that diffusion probabilistic models can synthesize high quality medical imaging data, which we show for Magnetic Resonance Images (MRI) and Computed Tomography (CT) images. We provide quantitative measurements of their performance through a reader study with two medical experts who rated the quality of the synthesized images in three categories: Realistic image appearance, anatomical correctness and consistency between slices. Furthermore, we demonstrate that synthetic images can be used in a self-supervised pre-training and improve the performance of breast segmentation models when data is scarce (dice score 0.91 vs. 0.95 without vs. with synthetic data). The code is publicly available on GitHub: https://github.com/FirasGit/medicaldiffusion.

Detecting out-of-distribution inputs for visual recognition models has become critical in safe deep learning. This paper proposes a novel hierarchical visual category modeling scheme to separate out-of-distribution data from in-distribution data through joint representation learning and statistical modeling. We learn a mixture of Gaussian models for each in-distribution category. There are many Gaussian mixture models to model different visual categories. With these Gaussian models, we design an in-distribution score function by aggregating multiple Mahalanobis-based metrics. We don't use any auxiliary outlier data as training samples, which may hurt the generalization ability of out-of-distribution detection algorithms. We split the ImageNet-1k dataset into ten folds randomly. We use one fold as the in-distribution dataset and the others as out-of-distribution datasets to evaluate the proposed method. We also conduct experiments on seven popular benchmarks, including CIFAR, iNaturalist, SUN, Places, Textures, ImageNet-O, and OpenImage-O. Extensive experiments indicate that the proposed method outperforms state-of-the-art algorithms clearly. Meanwhile, we find that our visual representation has a competitive performance when compared with features learned by classical methods. These results demonstrate that the proposed method hasn't weakened the discriminative ability of visual recognition models and keeps high efficiency in detecting out-of-distribution samples.

The steady improvement of Diffusion Models for visual synthesis has given rise to many new and interesting use cases of synthetic images but also has raised concerns about their potential abuse, which poses significant societal threats. To address this, fake images need to be detected and attributed to their source model, and given the frequent release of new generators, realistic applications need to consider an Open-Set scenario where some models are unseen at training time. Existing forensic techniques are either limited to Closed-Set settings or to GAN-generated images, relying on fragile frequency-based "fingerprint" features. By contrast, we propose a simple yet effective framework that incorporates features from large pre-trained foundation models to perform Open-Set origin attribution of synthetic images produced by various generative models, including Diffusion Models. We show that our method leads to remarkable attribution performance, even in the low-data regime, exceeding the performance of existing methods and generalizes better on images obtained from a diverse set of architectures. We make the code publicly available at: https://github.com/ciodar/UniversalAttribution.

This study explores the utilization of Dermatoscopic synthetic data generated through stable diffusion models as a strategy for enhancing the robustness of machine learning model training. Synthetic data generation plays a pivotal role in mitigating challenges associated with limited labeled datasets, thereby facilitating more effective model training. In this context, we aim to incorporate enhanced data transformation techniques by extending the recent success of few-shot learning and a small amount of data representation in text-to-image latent diffusion models. The optimally tuned model is further used for rendering high-quality skin lesion synthetic data with diverse and realistic characteristics, providing a valuable supplement and diversity to the existing training data. We investigate the impact of incorporating newly generated synthetic data into the training pipeline of state-of-art machine learning models, assessing its effectiveness in enhancing model performance and generalization to unseen real-world data. Our experimental results demonstrate the efficacy of the synthetic data generated through stable diffusion models helps in improving the robustness and adaptability of end-to-end CNN and vision transformer models on two different real-world skin lesion datasets.

Previous works for PCB defect detection based on image difference and image processing techniques have already achieved promising performance. However, they sometimes fall short because of the unaccounted defect patterns or over-sensitivity about some hyper-parameters. In this work, we design a deep model that accurately detects PCB defects from an input pair of a detect-free template and a defective tested image. A novel group pyramid pooling module is proposed to efficiently extract features of a large range of resolutions, which are merged by group to predict PCB defect of corresponding scales. To train the deep model, a dataset is established, namely DeepPCB, which contains 1,500 image pairs with annotations including positions of 6 common types of PCB defects. Experiment results validate the effectiveness and efficiency of the proposed model by achieving 98.6% mAP @ 62 FPS on DeepPCB dataset. This dataset is now available at: https://github.com/tangsanli5201/DeepPCB.

In monocular depth estimation, uncertainty estimation approaches mainly target the data uncertainty introduced by image noise. In contrast to prior work, we address the uncertainty due to lack of knowledge, which is relevant for the detection of data not represented by the training distribution, the so-called out-of-distribution (OOD) data. Motivated by anomaly detection, we propose to detect OOD images from an encoder-decoder depth estimation model based on the reconstruction error. Given the features extracted with the fixed depth encoder, we train an image decoder for image reconstruction using only in-distribution data. Consequently, OOD images result in a high reconstruction error, which we use to distinguish between in- and out-of-distribution samples. We built our experiments on the standard NYU Depth V2 and KITTI benchmarks as in-distribution data. Our post hoc method performs astonishingly well on different models and outperforms existing uncertainty estimation approaches without modifying the trained encoder-decoder depth estimation model.

There is an increasingly apparent need for validating the classifications made by deep learning systems in safety-critical applications like autonomous vehicle systems. A number of recent papers have proposed methods for detecting anomalous image data that appear different from known inlier data samples, including reconstruction-based autoencoders. Autoencoders optimize the compression of input data to a latent space of a dimensionality smaller than the original input and attempt to accurately reconstruct the input using that compressed representation. Since the latent vector is optimized to capture the salient features from the inlier class only, it is commonly assumed that images of objects from outside of the training class cannot effectively be compressed and reconstructed. Some thus consider reconstruction error as a kind of novelty measure. Here we suggest that reconstruction-based approaches fail to capture particular anomalies that lie far from known inlier samples in latent space but near the latent dimension manifold defined by the parameters of the model. We propose incorporating the Mahalanobis distance in latent space to better capture these out-of-distribution samples and our results show that this method often improves performance over the baseline approach.

In recent years, the deterioration of artificial materials used in structures has become a serious social issue, increasing the importance of inspections. Non-destructive testing is gaining increased demand due to its capability to inspect for defects and deterioration in structures while preserving their functionality. Among these, Laser Ultrasonic Visualization Testing (LUVT) stands out because it allows the visualization of ultrasonic propagation. This makes it visually straightforward to detect defects, thereby enhancing inspection efficiency. With the increasing number of the deterioration structures, challenges such as a shortage of inspectors and increased workload in non-destructive testing have become more apparent. Efforts to address these challenges include exploring automated inspection using machine learning. However, the lack of anomalous data with defects poses a barrier to improving the accuracy of automated inspection through machine learning. Therefore, in this study, we propose a method for automated LUVT inspection using an anomaly detection approach with a diffusion model that can be trained solely on negative examples (defect-free data). We experimentally confirmed that our proposed method improves defect detection and localization compared to general object detection algorithms used previously.

As the demand for high-quality data in model training grows, researchers and developers are increasingly generating synthetic data to tune and train LLMs. A common assumption about synthetic data is that sampling from instruct-tuned models is sufficient; however, these models struggle to produce diverse outputs-a key requirement for generalization. Despite various prompting methods, in this work we show that achieving meaningful diversity from instruct-tuned models remains challenging. In contrast, we find base models without post-training exhibit greater diversity, but are less capable at instruction following and hence of lower quality. Leveraging this insight, we propose Base-Refine (BARE), a synthetic data generation method that combines the diversity of base models with the quality of instruct-tuned models through a two-stage process. With minimal few-shot examples and curation, BARE generates diverse and high-quality datasets, improving downstream task performance. We show that fine-tuning with as few as 1,000 BARE-generated samples can reach performance comparable to the best similarly sized models on LiveCodeBench tasks. Furthermore, fine-tuning with BARE-generated data achieves a 101% improvement over instruct-only data on GSM8K and a 18.4% improvement over SOTA methods on RAFT.

Synthetic data has been proposed as a solution to address the issue of high-quality data scarcity in the training of large language models (LLMs). Studies have shown that synthetic data can effectively improve the performance of LLMs on downstream benchmarks. However, despite its potential benefits, our analysis suggests that there may be inherent flaws in synthetic data. The uniform format of synthetic data can lead to pattern overfitting and cause significant shifts in the output distribution, thereby reducing the model's instruction-following capabilities. Our work delves into these specific flaws associated with question-answer (Q-A) pairs, a prevalent type of synthetic data, and presents a method based on unlearning techniques to mitigate these flaws. The empirical results demonstrate the effectiveness of our approach, which can reverse the instruction-following issues caused by pattern overfitting without compromising performance on benchmarks at relatively low cost. Our work has yielded key insights into the effective use of synthetic data, aiming to promote more robust and efficient LLM training.

Artificial Intelligence (AI)-driven defect inspection is pivotal in industrial manufacturing. Yet, many methods, tailored to specific pipelines, grapple with diverse product portfolios and evolving processes. Addressing this, we present the Incremental Unified Framework (IUF), which can reduce the feature conflict problem when continuously integrating new objects in the pipeline, making it advantageous in object-incremental learning scenarios. Employing a state-of-the-art transformer, we introduce Object-Aware Self-Attention (OASA) to delineate distinct semantic boundaries. Semantic Compression Loss (SCL) is integrated to optimize non-primary semantic space, enhancing network adaptability for novel objects. Additionally, we prioritize retaining the features of established objects during weight updates. Demonstrating prowess in both image and pixel-level defect inspection, our approach achieves state-of-the-art performance, proving indispensable for dynamic and scalable industrial inspections. Our code will be released at https://github.com/jqtangust/IUF.

Shrinking pattern dimensions leads to an increased variety of defect types in semiconductor devices. This has spurred innovation in patterning approaches such as Directed self-assembly (DSA) for which no traditional, automatic defect inspection software exists. Machine Learning-based SEM image analysis has become an increasingly popular research topic for defect inspection with supervised ML models often showing the best performance. However, little research has been done on obtaining a dataset with high-quality labels for these supervised models. In this work, we propose a method for obtaining coherent and complete labels for a dataset of hexagonal contact hole DSA patterns while requiring minimal quality control effort from a DSA expert. We show that YOLOv8, a state-of-the-art neural network, achieves defect detection precisions of more than 0.9 mAP on our final dataset which best reflects DSA expert defect labeling expectations. We discuss the strengths and limitations of our proposed labeling approach and suggest directions for future work in data-centric ML-based defect inspection.

Quality control is of vital importance during electronics production. As the methods of producing electronic circuits improve, there is an increasing chance of solder defects during assembling the printed circuit board (PCB). Many technologies have been incorporated for inspecting failed soldering, such as X-ray imaging, optical imaging, and thermal imaging. With some advanced algorithms, the new technologies are expected to control the production quality based on the digital images. However, current algorithms sometimes are not accurate enough to meet the quality control. Specialists are needed to do a follow-up checking. For automated X-ray inspection, joint of interest on the X-ray image is located by region of interest (ROI) and inspected by some algorithms. Some incorrect ROIs deteriorate the inspection algorithm. The high dimension of X-ray images and the varying sizes of image dimensions also challenge the inspection algorithms. On the other hand, recent advances on deep learning shed light on image-based tasks and are competitive to human levels. In this paper, deep learning is incorporated in X-ray imaging based quality control during PCB quality inspection. Two artificial intelligence (AI) based models are proposed and compared for joint defect detection. The noised ROI problem and the varying sizes of imaging dimension problem are addressed. The efficacy of the proposed methods are verified through experimenting on a real-world 3D X-ray dataset. By incorporating the proposed methods, specialist inspection workload is largely saved.

Deep generative models have been demonstrated as state-of-the-art density estimators. Yet, recent work has found that they often assign a higher likelihood to data from outside the training distribution. This seemingly paradoxical behavior has caused concerns over the quality of the attained density estimates. In the context of hierarchical variational autoencoders, we provide evidence to explain this behavior by out-of-distribution data having in-distribution low-level features. We argue that this is both expected and desirable behavior. With this insight in hand, we develop a fast, scalable and fully unsupervised likelihood-ratio score for OOD detection that requires data to be in-distribution across all feature-levels. We benchmark the method on a vast set of data and model combinations and achieve state-of-the-art results on out-of-distribution detection.

Synthetic data is becoming increasingly important for accelerating the development of language models, both large and small. Despite several successful use cases, researchers also raised concerns around model collapse and drawbacks of imitating other models. This discrepancy can be attributed to the fact that synthetic data varies in quality and diversity. Effective use of synthetic data usually requires significant human effort in curating the data. We focus on using synthetic data for post-training, specifically creating data by powerful models to teach a new skill or behavior to another model, we refer to this setting as Generative Teaching. We introduce AgentInstruct, an extensible agentic framework for automatically creating large amounts of diverse and high-quality synthetic data. AgentInstruct can create both the prompts and responses, using only raw data sources like text documents and code files as seeds. We demonstrate the utility of AgentInstruct by creating a post training dataset of 25M pairs to teach language models different skills, such as text editing, creative writing, tool usage, coding, reading comprehension, etc. The dataset can be used for instruction tuning of any base model. We post-train Mistral-7b with the data. When comparing the resulting model Orca-3 to Mistral-7b-Instruct (which uses the same base model), we observe significant improvements across many benchmarks. For example, 40% improvement on AGIEval, 19% improvement on MMLU, 54% improvement on GSM8K, 38% improvement on BBH and 45% improvement on AlpacaEval. Additionally, it consistently outperforms other models such as LLAMA-8B-instruct and GPT-3.5-turbo.

Identifying defect patterns in a wafer map during manufacturing is crucial to find the root cause of the underlying issue and provides valuable insights on improving yield in the foundry. Currently used methods use deep neural networks to identify the defects. These methods are generally very huge and have significant inference time. They also require GPU support to efficiently operate. All these issues make these models not fit for on-line prediction in the manufacturing foundry. In this paper, we propose an extremely simple yet effective technique to extract features from wafer images. The proposed method is extremely fast, intuitive, and non-parametric while being explainable. The experiment results show that the proposed pipeline outperforms conventional deep learning models. Our feature extraction requires no training or fine-tuning while preserving the relative shape and location of data points as revealed by our interpretability analysis.

Large-scale Vision-Language Models (VLMs) have transformed general-purpose visual recognition through strong zero-shot capabilities. However, their performance degrades significantly in niche, safety-critical domains such as industrial spill detection, where hazardous events are rare, sensitive, and difficult to annotate. This scarcity -- driven by privacy concerns, data sensitivity, and the infrequency of real incidents -- renders conventional fine-tuning of detectors infeasible for most industrial settings. We address this challenge by introducing a scalable framework centered on a high-quality synthetic data generation pipeline. We demonstrate that this synthetic corpus enables effective Parameter-Efficient Fine-Tuning (PEFT) of VLMs and substantially boosts the performance of state-of-the-art object detectors such as YOLO and DETR. Notably, in the absence of synthetic data (SynSpill dataset), VLMs still generalize better to unseen spill scenarios than these detectors. When SynSpill is used, both VLMs and detectors achieve marked improvements, with their performance becoming comparable. Our results underscore that high-fidelity synthetic data is a powerful means to bridge the domain gap in safety-critical applications. The combination of synthetic generation and lightweight adaptation offers a cost-effective, scalable pathway for deploying vision systems in industrial environments where real data is scarce/impractical to obtain. Project Page: https://synspill.vercel.app

Extracting in-distribution (ID) images from noisy images scraped from the Internet is an important preprocessing for constructing datasets, which has traditionally been done manually. Automating this preprocessing with deep learning techniques presents two key challenges. First, images should be collected using only the name of the ID class without training on the ID data. Second, as we can see why COCO was created, it is crucial to identify images containing not only ID objects but also both ID and out-of-distribution (OOD) objects as ID images to create robust recognizers. In this paper, we propose a novel problem setting called zero-shot in-distribution (ID) detection, where we identify images containing ID objects as ID images (even if they contain OOD objects), and images lacking ID objects as OOD images without any training. To solve this problem, we leverage the powerful zero-shot capability of CLIP and present a simple and effective approach, Global-Local Maximum Concept Matching (GL-MCM), based on both global and local visual-text alignments of CLIP features. Extensive experiments demonstrate that GL-MCM outperforms comparison methods on both multi-object datasets and single-object ImageNet benchmarks. The code will be available via https://github.com/AtsuMiyai/GL-MCM.

The usage of electronic devices increases, and becomes predominant in most aspects of life. Surface Mount Technology (SMT) is the most common industrial method for manufacturing electric devices in which electrical components are mounted directly onto the surface of a Printed Circuit Board (PCB). Although the expansion of electronic devices affects our lives in a productive way, failures or defects in the manufacturing procedure of those devices might also be counterproductive and even harmful in some cases. It is therefore desired and sometimes crucial to ensure zero-defect quality in electronic devices and their production. While traditional Image Processing (IP) techniques are not sufficient to produce a complete solution, other promising methods like Deep Learning (DL) might also be challenging for PCB inspection, mainly because such methods require big adequate datasets which are missing, not available or not updated in the rapidly growing field of PCBs. Thus, PCB inspection is conventionally performed manually by human experts. Unsupervised Learning (UL) methods may potentially be suitable for PCB inspection, having learning capabilities on the one hand, while not relying on large datasets on the other. In this paper, we introduce ChangeChip, an automated and integrated change detection system for defect detection in PCBs, from soldering defects to missing or misaligned electronic elements, based on Computer Vision (CV) and UL. We achieve good quality defect detection by applying an unsupervised change detection between images of a golden PCB (reference) and the inspected PCB under various setting. In this work, we also present CD-PCB, a synthesized labeled dataset of 20 pairs of PCB images for evaluation of defect detection algorithms.

Dataset distillation has emerged as a powerful approach for reducing data requirements in deep learning. Among various methods, distribution matching-based approaches stand out for their balance of computational efficiency and strong performance. However, existing distance metrics used in distribution matching often fail to accurately capture distributional differences, leading to unreliable measures of discrepancy. In this paper, we reformulate dataset distillation as a minmax optimization problem and introduce Neural Characteristic Function Discrepancy (NCFD), a comprehensive and theoretically grounded metric for measuring distributional differences. NCFD leverages the Characteristic Function (CF) to encapsulate full distributional information, employing a neural network to optimize the sampling strategy for the CF's frequency arguments, thereby maximizing the discrepancy to enhance distance estimation. Simultaneously, we minimize the difference between real and synthetic data under this optimized NCFD measure. Our approach, termed Neural Characteristic Function Matching (), inherently aligns the phase and amplitude of neural features in the complex plane for both real and synthetic data, achieving a balance between realism and diversity in synthetic samples. Experiments demonstrate that our method achieves significant performance gains over state-of-the-art methods on both low- and high-resolution datasets. Notably, we achieve a 20.5\% accuracy boost on ImageSquawk. Our method also reduces GPU memory usage by over 300times and achieves 20times faster processing speeds compared to state-of-the-art methods. To the best of our knowledge, this is the first work to achieve lossless compression of CIFAR-100 on a single NVIDIA 2080 Ti GPU using only 2.3 GB of memory.

Formula-driven supervised learning (FDSL) has been shown to be an effective method for pre-training vision transformers, where ExFractalDB-21k was shown to exceed the pre-training effect of ImageNet-21k. These studies also indicate that contours mattered more than textures when pre-training vision transformers. However, the lack of a systematic investigation as to why these contour-oriented synthetic datasets can achieve the same accuracy as real datasets leaves much room for skepticism. In the present work, we develop a novel methodology based on circular harmonics for systematically investigating the design space of contour-oriented synthetic datasets. This allows us to efficiently search the optimal range of FDSL parameters and maximize the variety of synthetic images in the dataset, which we found to be a critical factor. When the resulting new dataset VisualAtom-21k is used for pre-training ViT-Base, the top-1 accuracy reached 83.7% when fine-tuning on ImageNet-1k. This is close to the top-1 accuracy (84.2%) achieved by JFT-300M pre-training, while the number of images is 1/14. Unlike JFT-300M which is a static dataset, the quality of synthetic datasets will continue to improve, and the current work is a testament to this possibility. FDSL is also free of the common issues associated with real images, e.g. privacy/copyright issues, labeling costs/errors, and ethical biases.