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May 7

A Tale of Two Sides of Wafer: Physical Implementation and Block-Level PPA on Flip FET with Dual-sided Signals

As the conventional scaling of logic devices comes to an end, functional wafer backside and 3D transistor stacking are consensus for next-generation logic technology, offering considerable design space extension for powers, signals or even devices on the wafer backside. The Flip FET (FFET), a novel transistor architecture combining 3D transistor stacking and fully functional wafer backside, was recently proposed. With symmetric dual-sided standard cell design, the FFET can deliver around 12.5% cell area scaling and faster but more energy-efficient libraries beyond other stacked transistor technologies such as CFET. Besides, thanks to the novel cell design with dual-sided pins, the FFET supports dual-sided signal routing, delivering better routability and larger backside design space. In this work, we demonstrated a comprehensive FFET evaluation framework considering physical implementation and block-level power-performance-area (PPA) assessment for the first time, in which key functions are dual-sided routing and dual-sided RC extraction. A 32-bit RISC-V core was used for the evaluation here. Compared to the CFET with single-sided signals, the FFET with single-sided signals achieved 23.3% post-P&R core area reduction, 25.0% higher frequency and 11.9% lower power at the same utilization, and 16.0 % higher frequency at the same core area. Meanwhile, the FFET supports dual-sided signals, which can further benefit more from flexible allocation of cell input pins on both sides. By optimizing the input pin density and BEOL routing layer number on each side, 10.6% frequency gain was realized without power degradation compared to the one with single-sided signal routing. Moreover, the routability and power efficiency of FFET barely degrades even with the routing layer number reduced from 12 to 5 on each side, validating the great space for cost-friendly design enabled by FFET.

  • 10 authors
·
Jan 25, 2025

SymRTLO: Enhancing RTL Code Optimization with LLMs and Neuron-Inspired Symbolic Reasoning

Optimizing Register Transfer Level (RTL) code is crucial for improving the power, performance, and area (PPA) of digital circuits in the early stages of synthesis. Manual rewriting, guided by synthesis feedback, can yield high-quality results but is time-consuming and error-prone. Most existing compiler-based approaches have difficulty handling complex design constraints. Large Language Model (LLM)-based methods have emerged as a promising alternative to address these challenges. However, LLM-based approaches often face difficulties in ensuring alignment between the generated code and the provided prompts. This paper presents SymRTLO, a novel neuron-symbolic RTL optimization framework that seamlessly integrates LLM-based code rewriting with symbolic reasoning techniques. Our method incorporates a retrieval-augmented generation (RAG) system of optimization rules and Abstract Syntax Tree (AST)-based templates, enabling LLM-based rewriting that maintains syntactic correctness while minimizing undesired circuit behaviors. A symbolic module is proposed for analyzing and optimizing finite state machine (FSM) logic, allowing fine-grained state merging and partial specification handling beyond the scope of pattern-based compilers. Furthermore, a fast verification pipeline, combining formal equivalence checks with test-driven validation, further reduces the complexity of verification. Experiments on the RTL-Rewriter benchmark with Synopsys Design Compiler and Yosys show that SymRTLO improves power, performance, and area (PPA) by up to 43.9%, 62.5%, and 51.1%, respectively, compared to the state-of-the-art methods.

  • 15 authors
·
Apr 14, 2025

ChipSeek-R1: Generating Human-Surpassing RTL with LLM via Hierarchical Reward-Driven Reinforcement Learning

Large Language Models (LLMs) show significant potential for automating Register-Transfer Level (RTL) code generation. However, current approaches face a critical challenge: they can not simultaneously optimize for functional correctness and hardware quality (Power, Performance, Area - PPA). Methods based on supervised fine-tuning often generate functionally correct but PPA-suboptimal code, lacking mechanisms to learn optimization principles. In contrast, post-processing techniques that attempt to improve PPA metrics after generation are often inefficient because they operate externally without updating the LLM's parameters, thus failing to enhance the model's intrinsic design capabilities. To bridge this gap, we introduce ChipSeek-R1, a hierarchical reward-driven reinforcement learning framework to train LLMs to generate RTL code that achieves both functional correctness and optimized PPA metrics. ChipSeek-R1 employs a hierarchical reward system, which incorporates direct feedback on syntax, functional correctness (from simulators) and PPA metrics (from synthesis tools) during reinforcement learning. This enables the model to learn complex hardware design trade-offs via trial-and-error, generating RTL code that is both functionally correct and PPA-optimized. Evaluating ChipSeek-R1 on standard benchmarks (VerilogEval, RTLLM), we achieve state-of-the-art results in functional correctness. Notably, on the RTLLM benchmark, ChipSeek-R1 generated 27 RTL designs surpassing the PPA metrics of the original human-written code. Our findings demonstrate the effectiveness of integrating toolchain feedback into LLM training and highlight the potential for reinforcement learning to enable automated generation of human-surpassing RTL code. We open-source our code in anonymous github.

  • 10 authors
·
Jul 7, 2025